Samsung Electronics Co., Ltd.

Sanjeeb Kumar Ghosh

Avneesh Singh Verma

Vishnu Kalyanamahadevi Gopalan Jawarlal

Saikat Hazra

Tamal Das

Sunil Rajan

Gunjan Mandal

Raghavendra Molthati

Praveen S Bharadwaj

Parin Rajnikant Bhuta

Sushrant Monga

Praveen Rathee

Krupal Jitendra Mehta

A Santosh Kumar Reddy

Ankit Garg

A system and method to dynamically control a reset signal for an IQ divider are provided. The system includes an IQ divider configured to output a IQ divider output clock; an input configured to receive a reference clock; a failure sensing circuit configured to sense a failure in the IQ divider output clock, the failure sensing circuit including an automatic frequency calibration (AFC) logic; and a control circuit configured to control a reset signal provided to the IQ divider, based on an output of the failure sensing circuit corresponding the failure sensed by the failure sensing circuit.

Method and system of dynamically controlling reset signal of IQ divider

Methods and systems for calibrating clock skew in a SerDes receiver. A method includes detecting a skew in a clock with respect to an edge of a reference clock, based on a value sampled by the clock and a value sampled by the reference clock at an edge of a data pattern, for a first Phase Interpolator (PI) code; determining a count of the skew from a de-serialized data word including outcome values obtained based on values sampled by the clock and values sampled by the reference clock at a predefined number of edges of the data pattern; obtaining a skew calibration code corresponding to the first PI code, from a binary variable obtained by accumulating an encoded variable to a previously generated binary variable; and calibrating the skew by performing a positive phase shift or a negative phase shift to the clock based on the skew calibration code.

Methods and systems for calibrating clock skew in a receiver

Built-in-self-test (BIST operations are performed by receiver lanes of a multilane receiver system, wherein at least one receiver lane is configured as a synthesized clock source for other receiver lanes configured to perform BIST operations. The at least one receiver lane configured as the synthesized clock source may generate a clock signal and provide the clock signal to the other receiver lanes performing the BIST operations. In some examples, digital control signals may be used for coordinating the enablement of the at least one receiver lane to function as the synthesized clock source and for coordinating the enablement of the other receiver lanes to perform BIST operations.

Methods and systems for performing built-in-self-test operations without a dedicated clock source

Accordingly embodiments herein disclose a quarter rate speculative DFE. The quarter rate speculative DFE includes a plurality of sampler circuits connected to an input terminal. The plurality of sampler circuits are configured to sample an input signal into a plurality of data samples in parallel. A plurality of quarter rate look ahead circuit connected to the plurality of sampler circuits. The plurality of quarter rate look ahead circuit is configured to simultaneously perform an align operation and a look ahead operation on the plurality of data samples based on the different clock phases to obtain a plurality of latched outputs. A plurality of multiplexers connected to the plurality of quarter rate look ahead circuit. The plurality of multiplexers is configured to generate two speculative data streams by multiplexing respective correction coefficients of each of the plurality of latched outputs.

Quarter rate speculative decision feedback equalizer (DFE) and method for operating thereof

An integrated circuit device includes a sensing circuit configured to determine a delay code from a plurality of delay codes using a phase interpolation (PI) code and a plurality of input clock phases, a variable delay circuit coupled to the sensing circuit and configured to generate a variable delay based on the delay code and generate a delayed PI code using the PI code and the delay code, the delayed PI code corresponding to a code obtained from adding the variable delay to the PI code, and a phase interpolator coupled to the variable delay circuit and configured to generate an output clock phase from the plurality of input clock phases using the delayed PI code.

Integrated device having phase interpolator and input controller thereof

A ring oscillator includes at least one oscillator stage having a first output and a second output and a start-up circuit. The start-up circuit includes a plurality of AC coupling capacitors receiving the first output and the second output, and a plurality of switches connected to the AC coupling capacitors. The start-up circuit is configured to provide a differential start-up voltage to at least one node of the oscillator using the plurality of switches and the AC coupling capacitors.

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Bengaluru, India

Sanjeeb Kumar Ghosh