Skhynix Inc.

Sangsik Kim

Haibo Li

Juhyeon Han

Systems and methods are provided to detect a developed bad word-line of a flash memory. Embodiments provide an improved Background media scan (BGMS) process that can predict at the end of a block read if a word-line will potentially become bad with the use of the flash memory. Accordingly, data from the potentially bad block can be recovered and the block can be retired. The embodiments can minimize the need for the expensive chip-kill method.

Growing community of inventors

San Jose, CA, United States of America

Sangsik Kim