Samsung Electronics Co., Ltd.

Sanghyun Ahn

Yeunwook Lim

Jongmin Kim

Minho Kim

Jongwu Baek

Bumsuk Chung

Hyungseok Kang

Sangduk Hwangbo

Busic Koag

Sungbo Shim

Minho Jeong

Hoyong Choi

Kyewan Park

Yonghoon Choi

Inkap Chang

A method of testing a semiconductor device includes obtaining first data generated by testing wafers, each including a plurality of chips, the obtaining based on a plurality of first items, obtaining second data generated by testing packages, each including a packaged chip, the obtaining based on a plurality of second items, detecting correlations between the plurality of first items and the plurality of second items, based on the first data and the second data, identifying at least one first item affecting variation of the packages, based on the correlations, and testing the identified at least one first item.

Method and system for testing and manufacturing semiconductor device

A method for executing a function of an electronic device is provided. The method includes identifying data of a first application, determining at least one second application in response to a user event and identifying an attribute of each of the at least one second application, and processing the data of the first application based on the attributes of the each of the at least one second application to execute a function related to at least one second application.

Electronic device and method of transferring data in an application to another application

Growing community of inventors

Daegu, South Korea

Sanghyun Ahn