Samsung Electronics Co., Ltd.

Samsung Display Co., Ltd.

Lg Electronics Inc.

Korea Advanced Institute of Science and Technology

Sanghyuk Kwon

Haesuk Lee

Youngcheon Kwon

Kyomin Sohn

Jaeyoun Youn

Eunchul Shin

Jangseok Lee

Il Ho Lee

Seongil O

Sanghun Bae

Sukhan Lee

Hoon Sohn

Jongpil Son

Minsang Koo

Yicheol Choi

Soonkyu Hwang

Hyunsung Shin

Jiho Park

Bongjae Kim

Sangwoo Choi

Chansik Noh

Sangmin Choi

Woojin Jung

Yeongbin Kim

A washing machine is configured to perform washing using carbon dioxide. The washing machine includes a first housing that defines an opening and an inner space, a drum disposed in the inner space of the first housing and configured to receive laundry, a barrier that is coupled to the first housing and seals the opening of the first housing, and a second housing that faces a surface of the barrier and is coupled to the first housing. The barrier defines (i) a first space between the first housing and the barrier from leaking and (ii) a second space between the second housing, where the barrier is configured to block liquid carbon dioxide injected into the first space from leaking into the second space.

Washing machine

An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.

Apparatus for inspecting a display panel for defects

A memory device according to some aspects of the inventive concepts includes a memory cell array including a plurality of banks, at least one Processing Element (PE) connected to at least one bank selected from the plurality of banks, and a control logic configured to control an active operation in which wordlines included in each of the plurality of banks is activated, and configured to control a refresh operation in which at least one bank is refreshed, based on a PE enable signal configured to selectively enable the at least one PE.

Memory devices including processing elements, and memory systems including memory devices

A memory device includes a memory bank including a plurality of banks, each including a memory cell array; a calculation logic including a plurality of processor-in-memory (PIM) circuits arranged in correspondence to the banks, each of the plurality of PIM circuits performing calculation processing using at least one selected from data provided from a host and information read from a corresponding bank among the banks; and a control logic configured to control a memory operation on the memory bank in response to a command and/or an address, each received from the host, or to control the calculation logic to perform the calculation processing, wherein reading operations are respectively performed in parallel on the banks for the calculation processing, offsets having different values are respectively configured for the banks, and information is read from different positions in respective memory cell arrays of the banks and provided to the PIM circuits.

Memory device performing parallel calculation processing, operating method thereof, and operating method of memory controller controlling the memory device

A testing device for testing a display module may include touch test pads electrically connected to touch pads of a display module, a first power test pad and a second power test pad electrically connected to a first power pad and a second power pad of the display module, a voltage generator providing a first test power voltage and a second power test voltage to the first power test pad and second power test pad, and a capacitance measurement circuit measuring capacitance between the first power test pad and second power test pad.

Testing device of display module, testing system including the same, and testing method using the same

A memory module includes semiconductor memory devices mounted on a circuit board and a control device mounted on the circuit board. Each semiconductor memory device includes a memory cell array to store data. The control device receives a command and an access address from an external device and provides the command and the access address to the semiconductor memory devices. Each semiconductor memory device performs an address swapping operation to randomly swap a portion of bits of the access address to generate a swapped address in response to a power-up signal or a reset signal, and enables a respective target word-line from among word-lines in the memory cell array such that two or more of the semiconductor memory devices enable different target word-lines in response to the access address.

Memory modules and stacked memory devices

Growing community of inventors

Seoul, South Korea

Sanghyuk Kwon