Samsung Display Co., Ltd.

Sanghui Park

Jinwook Lee

Taehyeok Choi

Myungho Kim

Keunchang Lee

Sangjin Park

Jaesung Cha

A resolution measurement apparatus includes a stage configured to receive a display module including an optical part. The stage includes an opening that overlaps the optical part, when viewed in a plan view, when the display module is disposed on the stage. The resolution measuring apparatus further includes a plurality of cameras disposed above the stage, a light source disposed under the stage and overlapping the opening when viewed in the plan view, and a lens disposed between the light source and the stage. The lens overlaps the opening when viewed in the plan view, and the optical part overlaps the lens, when viewed in the plan view, when the display module is disposed on the stage.

Resolution measurement apparatus and resolution measurement method using the same

A thin film transistor (TFT) array substrate is disclosed. In one aspect, the substrate includes a buffer layer formed over a substrate, a storage capacitor formed in the buffer layer and including a first electrode and a second electrode surrounding and insulated from the first electrode and a driving TFT formed over the buffer layer.

Thin film transistor array substrate, method of manufacturing the same, and organic light-emitting diode (OLED) display including the same

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Yongin, South Korea

Sanghui Park