Cypress Semiconductor Corporation

Sangeeta Thakur

Pidugu L Narayana

Johnie Au

Daniel Eric Cress

Emad Hamadeh

A circuit, method and test architecture may be used for testing one or more integrated circuits that may be arranged upon a printed circuit board. Along with internal logic used by the integrated circuit during normal functioning, circuitry is included for built-in self-test. In an embodiment, the integrated circuits are semiconductor memories and include Memory Built-In Self-Test (MBIST) capability. A JTAG-compliant interface may be used to control the MBIST circuitry so that MBIST test modes can be selected by the JTAG Test Access Port controller, and MBIST test results can be written into boundary scan cells and scanned out through the JTAG Test Data Out port. The addition of a high-speed clock signal to the standard 4-wire JTAG interface allows full-speed operation of the MBIST circuitry. Therefore, the integrated circuit can be tested at full speed, and the test results scanned out by the slower JTAG clock. The use of the JTAG interface with MBIST allows multiple interconnected devices to be tested using a single interface. This is advantageous for in-circuit testing, since it is not necessary to directly probe each device to be tested. It also simplifies the use of automated test equipment, since the JTAG standard is widely used.

Semiconductor memory self-test controllable at board level using standard interface

An apparatus comprising a first circuit and a second circuit. The first circuit generally comprises a first built in self test (BIST) circuit configured to test the first circuit. The second circuit generally comprises a second BIST circuit configured to test the second circuit. The second circuit may not be adjacent to the first circuit.

Distributed test architecture for multiport RAMs or other circuitry

A circuit comprising (i) one or more input paths, (ii) one or more output paths, and (iii) one or more switch circuits. The switch circuits may be configured to connect one or more of said input paths to one or more of said output data in response to one or more control signals. The present invention may be used to read and/or write data in one or more modes of operation such as 9-Bit Big Endian Write, 9-bit Little Endian Write, 18-bit Big Endian Write, 18-bit Little Endian Write, a 36-bit Write, 9-Bit Big Endian Read, 9-bit Little Endian Read, 18-bit Big Endian Read, 18-bit Little Endian Read, 36-bit Read or other mode.

Fifo bus-sizing, bus-matching datapath architecture

A circuit comprising a clock generator and a state machine. The clock generator may be configured to generate an output clock signal in response to (i) a first enable signal and (ii) a second enable signal. The state machine may be configured to generate the second enable signal in response to a first and a second control signal.

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Sunnyvale, CA, United States of America

Sangeeta Thakur