Samsung Electronics Co., Ltd.

Sang Yong Yoon

Bo Geun Kim

Ki Tae Park

Moo Sung Kim

Hyun Jun Yoon

Dong Hyuk Chae

Jun-Ho Seo

Min Soo Kim

Jae Hong Kim

Hong Rak Son

Jung Ho Lee

Yong June Kim

Won-Taeck Jung

Ki Jun Lee

Seong Hyeog Choi

Jung Soo Chung

Jeong Hoon Nam

Dae Sik Ham

Gi Baek Kim

Hyeon Su Bak

A storage device and an operating method of the storage device are provided. The storage device comprises a first non-volatile memory device, a second non-volatile memory device, a third non-volatile memory device a storage controller configured to control the first non-volatile memory device, the second non-volatile memory device, and the third non-volatile memory device, control the first non-volatile memory device to extract a first on-cell count value after a first soft erase operation, set first to third read level offsets of the respective first to third non-volatile memory devices based on the respective first to third on-cell count values, select the first to third defense code parameter sets each corresponding to the respective first to third read level offsets, and transmits first to third read commands based on the selected respective first to third defense code parameter sets to the respective first to third non-volatile memory devices.

Storage controller and storage device including the same

A non-volatile memory device including: a first string including a first string select transistor, a first memory cell and a first ground select transistor, a second string including a second string select transistor, a second memory cell and a second ground select transistor, and a controller to apply a pass voltage to a first string select line from a first time, apply a first read voltage to a first word line during a first read section from the first time to a second time, apply a first ground select line voltage to a first ground select line from the first time, apply a ground voltage to a second string select line, apply the first ground select line voltage to a second ground select line during a first control section, and apply a first common source line voltage to a common source line during the first control section.

Non-volatile memory device and an operation method thereof

An apparatus and a method for reading from a non-volatile memory whereby soft decision data is used to determine the reliability of hard decision data. The hard decision data read from the non-volatile memory is de-randomized and the soft decision data read from the non-volatile memory is not de-randomized. Using the soft decision data, the hard decision data is decoded.

Method of reliably reading data stored in multi-level cell (MLC) non-volatile memory

A method of programming a flash memory device comprises programming selected memory cells, performing a verification operation to determine whether the selected memory cells have reached a target program state, and determining a start point of the verification operation based on a programming characteristic associated with a detection of a pass bit during programming of an initial program state.

Flash memory device using adaptive program verification scheme and related method of operation

A memory system comprises a multi-bit memory device and a memory controller that controls the multi-bit memory device. The memory system determines whether a requested program operation is a random program operation or a sequential program operation. Where the requested program operation is a random program operation, the memory controller controls the multi-bit memory device to perform operations according to a fine program close policy or a fine program open policy.

Method and apparatus for managing open blocks in nonvolatile memory device

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Seoul, South Korea

Sang Yong Yoon