Samsung Electronics Co., Ltd.

Sang-Yong Yoon

Kyung-Ryun Kim

Hye-Jin Yim

Si-Hwan Kim

Ki-Whan Song

Il-Han Park

Dong-Ku Kang

Jin-Young Chun

Bo-Geun Kim

Joon-Suc Jang

Ji-Suk Kim

Yong-Sung Cho

Seung-Hwan Shin

Sang-In Park

Nam-hee Lee

Gyu-Seon Rhim

Sung-Woon Choi

A method is provided for operating a memory device. The method includes counting, from among memory cells, a number of first off-cells with respect to a first reading voltage and a number of second off-cells with respect to a second reading voltage, comparing the number of first off-cells and the number of second off-cells, and determining, based on a result of the comparing, whether a programming error exists in a storage region in which the memory cells are included.

Memory system including a memory device, and methods of operating the memory system and memory device

A method for controlling error check and correction (ECC) of a non-volatile memory device includes storing write data in a plurality of storing regions. The write data may be generated by performing ECC encoding. Individual ECC decoding may be performed based on each of a plurality of read data read out from the storing regions. Logic operation data may be provided by performing a logic operation of the read data when the individual ECC decoding fails with respect to all of the read data. Combined ECC decoding may be performed based on the logic operation data.

Method of controlling error check and correction (ECC) of non-volatile memory device and memory system performing the same

Memory system including a memory device, and methods of operating the memory system and the memory device

A method of operating a nonvolatile memory device includes performing a first memory operation on a first memory block of a plurality of memory blocks and a curing operation on a portion of the first memory block when a status signal indicates a ready state of the nonvolatile memory device during an interval equal to or greater than a reference interval after the first memory operation is completed. The nonvolatile memory device includes the plurality of memory blocks, each memory block including a plurality of vertical strings extending in a vertical direction with respect to a substrate.

Methods of operating nonvolatile memory devices, and memory systems including nonvolatile memory devices

A flash memory, a flash memory system, and an operating method thereof. The method of operating a flash memory includes counting the number of memory cells having threshold voltages included in a first adjacent threshold voltage range (defined by a first reference read voltage for distinguishing between initially separated adjacently located threshold voltage distributions and a first search read voltage having a first voltage difference from the first reference read voltage), and a second adjacent threshold voltage range (defined by the first reference read voltage and a second search read voltage having a second voltage difference from the first reference read voltage), and setting a first optimal read voltage based on the difference between the first and second counted numbers of the memory cells.

Flash memory, flash memory system and operating method of the same

A method is for operating a memory system including a memory device. The method includes managing program order information of the memory device based on a program order stamp (POS) indicating a relative temporal relationship between program operations of a plurality of memory groups that are included in the memory device, and controlling a read voltage for performing a read operation on the memory device. The read voltage is controlled based on the program order information and a mapping table that stores a read voltage offset and a POS corresponding to the read voltage offset.

Operating a memory device using a program order stamp to control a read voltage

In a method of optimizing a log likelihood ratio (LLR) used to correct errors related to data stored in a nonvolatile memory device, variation of threshold voltage distribution for a plurality of memory cells included in the nonvolatile memory device is monitored, and the LLR for the memory cells is updated based on a monitoring result. Although the characteristics of the memory cells are deteriorated, the LLR is continuously maintained to the optimal value.

Method and device for optimizing log likelihood ratio (LLR) used for nonvolatile memory device and for correcting errors in nonvolatile memory device

In a method of reading data from a nonvolatile memory device, a first read operation for memory cells coupled to a first word line is performed by applying a first read voltage to the first word line, a first read retry is performed to obtain an optimal read level regardless or independent of whether data read by the first read operation is error-correctable, and the optimal read level is stored to perform a subsequent second read operation using the optimal read level. Related methods and devices are also discussed.

Method of reading data from a nonvolatile memory device, nonvolatile memory device, and method of operating a memory system

A method of operating a data storage device includes providing a memory cell array that includes a first word line, a second word line and a buffer configured to store second data to be programmed into the second word line, reading the second data from the buffer, and programming first data into the first word line. A programming condition of the first data being is changed based on the second data read from the buffer.

Data storage system and method of operating data storage system

A method of writing data in a non-volatile memory device includes receiving a program command and a first row address corresponding to a first word line; performing a first partial programming operation with respect to first memory cells coupled to the first word line; performing a second partial programming operation with respect to second memory cells coupled to a second word line adjacent to the first word line; performing a first verification operation by verifying the first partial programming operation; and selectively performing a first additional programming operation with respect to the first memory cells depending on a result of the first verification operation.

Method of writing data in non-volatile memory device

A method of operating a nonvolatile memory device by programming pages using a N-bit programming mode until a threshold voltage distribution shift for an un-programmed page in the same memory block is determined, and thereafter programming the un-programmed page using a M-bit programming mode, where M is less than N.

Method of operating a nonvolatile memory device having read disturbed page

In an operating method for a nonvolatile memory device, first random data is sensed from a source area of the memory cell array, the first random data having been generated using first random sequence data. While sensing the first random data, third random sequence data is loaded to a page buffer circuit, the third random sequence data being generated from the first random sequence data and second random sequence data. A logical operation is performed on the sensed first random data and the third random sequence data in the page buffer circuit to generate second random data, and the second random data is programmed to a target area in the memory cell array different from the source area.

Method of operating nonvolatile memory devices storing randomized data generated by copyback operation

In method of programming a nonvolatile memory device, multi-bit data are loaded into a plurality of page buffers. Multi-level cells included in a multi-level cell block are programmed to a plurality of intermediate program states including a first intermediate program state and a second intermediate program state which is higher than the first intermediate program state based on the multi-bit data. Whether the multi-level cells are programmed to the plurality of intermediate program states is verified. Cell group information for the first intermediate program state is generated by checking whether a result of the verification for the second intermediate program state satisfies a predetermined criterion. The multi-level cells are programmed to a plurality of target program states corresponding to the multi-bit data based on the cell group information.

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Seoul, South Korea

Sang-Yong Yoon