Samsung Electronics Co., Ltd.

Sang-Yeop Baeck

Jae-Seung Choi

Inhak Lee

Dong-Wook Seo

Hyunsu Choi

Tae-Hyung Kim

Tae-hyung Kim

Hoon Bae Kim

Taejoong Song

Jisu Yu

Daeyoung Moon

Dae-young Moon

Sun-Yung Jang

Jung-Myung Kang

SangShin Han

In-Hak Lee

JaeSeung Choi

Jin-sung Kim

Jung-Ho Do

Sang-shin Han

Siddharth Gupta

Jae-hyun Lim

Jang-Hwan Yoon

Younghwan Park

Sunghyun Park

Jaesung Choi

Ho Young Tang

Provided are a three-dimensional (3D) semiconductor integrated circuit and a static random access memory (SRAM) device. The three-dimensional (3D) semiconductor integrated circuit includes: a first die including a power supply circuit a second die including an SRAM with a through-silicon-via (TSV) bundle region; a third die including a processor; and TSVs, each of which is provided on the TSV bundle region and extends from the TSV bundle region to the third die. The SRAM device includes: a bank array with banks, each of which includes sub-bit-cell arrays and a local peripheral circuit region arranged in a cross (+) shape between the sub-bit-cell arrays; and a global peripheral circuit region including a tail peripheral circuit region extending in a first direction and a head peripheral circuit region extending in a second direction, the tail peripheral circuit region and the head peripheral circuit region being arranged in a 'T' shape.

SRAM device and 3D semiconductor integrated circuit thereof

Disclosed is a static random access memory (SRAM) device. According to example embodiments of the present disclosure, a control logic of the SRAM device may include a tracking circuit connected with metal lines for tracking the number of columns of a memory cell array and the number of rows of the memory cell array. By the tracking circuit, a length of word lines of the memory cell array and a length of bit lines of the memory cell array may be tracked. The control logic of the SRAM device may generate control pulses optimized for the size of the memory cell array, based on a tracking result(s) of the tracking circuit. Accordingly, a power and a time necessary for a write operation and a read operation may be reduced.

Static random access memory device

A semiconductor device includes an active area extending in a first direction, a first transistor including a first gate electrode and first source and drain areas disposed on the active area, the first source and drain areas being disposed at opposite sides of the first gate electrode, a second transistor including a second gate electrode and second source and drain areas disposed on the active area, the second source and drain areas being disposed at opposite sides of the second gate electrode, and a third transistor including a third gate electrode and third source and drain areas disposed on the active area, the third source and drain areas being disposed at opposite sides of the third gate electrode, and the first gate electrode, the second gate electrode, and the third gate electrode extending in a second direction different from the first direction. The second transistor is configured to turn on and off, based on an operation mode of the semiconductor device.

Semiconductor device for selectively performing isolation function and layout displacement method thereof

Provided is an integrated circuit which includes: a plurality of conductive lines extending in a first horizontal direction on a plane separate from a gate line, and including first and second conductive lines; a source/drain contact having a bottom surface connected to a source/drain region, and including a lower source/drain contact and an upper source/drain contact which are connected to each other in a vertical direction; and a gate contact having a bottom surface connected to the gate line, and extending in the vertical direction, in which the upper source/drain contact is placed below the first conductive line, and the gate contact is placed below the second conductive line. A top surface of the lower source/drain contact may be larger than a bottom surface of the upper source/drain contact.

Integrated circuit having heterogeneous gate contacts over active regions

A semiconductor device including memory cell transistors on a substrate is provided. The semiconductor device includes a first wiring layer on the memory cell transistors and including a bit line and a first conductive pattern, a second wiring layer on the first wiring layer and including a ground line, a first via interposed between and electrically connecting the bit line and a source/drain of a first memory cell transistor among the memory cell transistors, and a first extended via interposed between the ground line and a source/drain of a second memory cell transistor among the memory cell transistors. The ground line is electrically connected to the source/drain of the second memory cell transistor through the first extended via and the first conductive pattern. The first extended via has a width greater than that of the first via.

Semiconductor devices

A memory device includes a first write assist circuit providing a cell voltage or a write assist voltage to a first memory cell connected with a first bit line pair, a first write driver that provides write data to the first memory cell through the first bit line pair, a second write assist circuit that provides the cell voltage or the write assist voltage to a second memory cell connected with a second bit line pair, and a second write driver that provides write data to the second memory cell through the second bit line pair. One of the first and second write assist circuits provides the write assist voltage in response to a column selection signal for selecting one write driver, which provides write data, from among the first, and second write drivers, and the other thereof provides the cell voltage in response to the column selection signal.

Memory devices comprising a write assist circuit

A memory device includes a memory cell array and a peripheral circuit. The memory cell array receives a first power supply voltage and includes a plurality of bit cells that store data based on the first power supply voltage. The peripheral circuit is receives a second power supply voltage and controls the memory cell array based on the second power supply voltage. The peripheral circuit includes a voltage generation circuit that receives the first power supply voltage and the second power supply voltage. The voltage generation circuit adaptively adjusts a word-line driving voltage directly or indirectly based on a difference between the first power supply voltage and the second power supply voltage during a memory operation on the plurality of bit cells, and applies the word-line driving voltage to a first word-line coupled to first bit cells selected from the bit cells.

Memory device system-on-chip including the same and method of operating the same

Provided are a voltage control circuit including an assist circuit and a memory device including the voltage control circuit. The memory device includes: a volatile memory cell array, which is connected to a plurality of word lines and includes a memory cell including at least one transistor; and an assist circuit, which is connected to at least one of the plurality of word lines and adjusts a driving voltage level of each of the plurality of word lines, wherein the assist circuit includes a diode N-channel metal oxide semiconductor (NMOS) transistor having a gate and a drain connected to each other.

Voltage control circuit including assist circuit and memory device including the same

Integrated circuit having heterogeneous source/drain and gate contacts

Layout of semiconductor device for selectively operating as insulating circuit or driving circuit

A semiconductor memory device includes at least one memory cell connected to an internal voltage line that receives a cell power supply voltage and a write assist circuit connected to the internal voltage line. The write assist circuit lowers a level of the cell power supply voltage to a target level during a first period of a write operation on the memory cell and maintains the level of the cell power supply voltage at the target level during a second period of the write operation based on a write assist control signal. The second period succeeds the first period.

Semiconductor memory devices

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Yongin-si, South Korea

Sang-Yeop Baeck