Hynix Semiconductor Inc.

Skhynix Inc.

Sang Kwon Lee

Tae Jin Kang

Kyu Dong Hwang

Chae Kyu Jang

Young Jun Yoon

Kwang Soon Kim

Young Hoon Kim

Kyoung Hwan Kwon

Bong Seok Han

Sang Il Park

Keun Soo Song

Dong Kyun Kim

Chul Moon Jung

Young Jun Nam

Hyeng Ouk Lee

Mi Hyun Hwang

Joon Ho Kim

Man Keun Kang

In Sung Koh

Tae Woo Kwon

Byung Jae Lee

Kwang Rae Cho

A semiconductor device may include a first buffer, a second buffer, a divider circuit and an internal signal generation circuit. The first buffer may buffer a first input signal and a second input signal to generate a first data strobe buffering signal and a first data strobe bar buffering signal. The second buffer may generate a second data strobe buffering signal based on the first input signal and a reference xvoltage. The divider circuit may divide the second data strobe buffering signal to generate a divided signal and a divided bar signal. The internal signal generation circuit may be configured to generate a first to fourth data latch timing signals having different phases based on the first data strobe buffering signal, the first data strobe bar buffering signal, the divided signal and the divided buffering signal.

Semiconductor device and system

A semiconductor device may include a first buffer, a second buffer, a divider circuit and an internal signal generation circuit. The first buffer may buffer a first input signal and a second input signal to generate a first data strobe buffering signal and a first data strobe bar buffering signal. The second buffer may generate a second data strobe buffering signal based on the first input signal and a reference voltage. The divider circuit may divide the second data strobe buffering signal to generate a divided signal and a divided bar signal. The internal signal generation circuit may be configured to generate a first to fourth data latch timing signals having different phases based on the first data strobe buffering signal, the first data strobe bar buffering signal, the divided signal and the divided buffering signal.

Semiconductor memory devices are provided. The semiconductor memory device includes an input/output (I/O) drive controller, a data I/O unit and a data transmitter. The input/output (I/O) drive controller generates drive control signals and an input control signal for driving first and second global I/O lines in a first test mode or a second test mode. The data I/O unit drives the first global I/O line in response to an input data when a write operation is executed in the first test mode. The data transmitter transfers the data on the first global I/O line onto first and second local I/O lines to store the data on the first global I/O line in a memory cell array portion when the write operation is executed in the first test mode. Related methods are also provided.

Semiconductor memory devices and methods of testing open failures thereof

A semiconductor device includes a decoded signal generation circuit suitable for executing a counting operation to generate a decoded signal in response to an oscillation signal during a refresh section, a refresh pulse generation circuit suitable for generating a refresh pulse for executing a refresh operation in response to the decoded signal and a temperature code, and a reset pulse generation circuit suitable for generating a reset pulse initializing the decoded signal in response to the refresh pulse.

Semiconductor device configured to generate a refresh pulse for executing a refresh operation in response to the decoded count signal and temperature code

Semiconductor memory devices are provided. The semiconductor memory device includes an input/output (I/O) drive controller, a data I/O unit and a data transmitter. The data I/O unit selectively drives a first global I/O line and first/second global I/O lines according to the first or second test modes. The data transmitter selectively transfers the data on the first global I/O line onto first and second local I/O lines to store the data on the first global I/O line, and the data on the first and second global I/O lines onto the first and second local I/O lines according to the first or second test modes.

A semiconductor system includes a first semiconductor device and a second semiconductor device. The first semiconductor device outputs command/address signals and a plurality of data. The second semiconductor device generates a first mode signal and a second mode signal according to a combination of the command/address signals. The second semiconductor device is suitable for inverting the plurality of data inputted through a pad in response to the first or the second mode signal to store the inverted data suitable for blocking input of the inverted data in response to the second mode signal if a number of bits having a predetermined level in the plurality of data is equal to or greater than a predetermined number.

Semiconductor devices and semiconductor systems including the same

A integrated circuit may include an input buffer suitable for buffering a strobe signal in response to a buffer enablement signal to generate an internal strobe signal, an internal clock generator suitable for receiving the internal strobe signal to generate internal clock signals including different phases. The integrated circuit may include a strobe signal driver suitable for driving the strobe signal in response to a drive control signal. The drive control signal may be enabled prior to the buffer enablement signal being enabled.

Integrated circuits and semiconductor systems including the same

The semiconductor memory device includes an internal flag signal generator and an active information generator. The internal flag signal generator generates a plurality of internal flag signals which are selectively enabled when combination signals of bank address signals and row address signals supplied are inputted from an external device at least a predetermined number of times. The active information generator outputs a flag signal enabled when at least one of the plurality of internal flag signals is enabled in response to a start signal for extracting information on a number of times that a word line is activated and outputs a plurality of bank information signals according to the plurality of internal flag signals. The active information generator generates internal bank address signals and internal row address signals according to the plurality of internal flag signals to refresh a bank.

Semiconductor memory devices and semiconductor systems including the same

Serializers are provided. The serializer includes a first drive control signal generator and a second drive control signal generator. The first drive control signal generator amplifies a first input data signal in response to a first clock signal and a second clock signal to generate a first pull-up drive control signal and a first pull-down drive control signal. The second drive control signal generator amplifies a second input data signal in response to the second clock signal and a third clock signal to generate a second pull-up drive control signal and a second pull-down drive control signal.

Serializers

A data input circuit includes a clock sampling unit, a final clock generation unit, and a write latch signal generation unit. The sampling unit is configured to generate a shifting signal including a pulse generated after a write latency is elapsed, and generate a sampling clock by sampling an internal clock during a burst period from substantially a time when the pulse of the shifting signal is generated. The final clock generation unit is configured to generate a level signal by latching the shifting signal in synchronization with the sampling clock and generate a final clock from the level signal in response to a burst signal. The write latch signal generation unit is configured to generate an enable signal by latching the final clock and generate a write latch signal for latching and outputting aligned data in response to the enable signal.

Data input circuit

A data transmission circuit includes: a driving voltage generation unit configured to generate a driving voltage having a lower level than an external driving voltage; a switch unit configured to transmit the driving voltage when any one of a write enable signal and a read enable signal is enabled; and a data transmission unit configured to be driven by receiving the driving voltage, transmit a signal of a DQ pad as data in response to the write enable signal, and transmit the data to the DQ pad in response to the read enable signal.

Data transmission circuit

The data control circuit includes an input/output line and a driver. The input/output line precharging circuit precharges a global input/output line to a predetermined voltage when either a reading operation or a writing operation is inoperative. The driver includes a number of MOS transistors and drives the global input/output line in response to receiving data from a local input/output line and a complementary local input/output line during the reading operation.

Data control circuit

A multi-phase clock generation circuit includes a first clock buffer unit configured to invert and buffer a first internal clock and a second internal clock in response to an external clock, and to generate a third internal clock and a fourth internal clock, and a second clock buffer unit configured to invert and buffer the third internal clock and the fourth internal clock in response to the external clock, and to generate the first internal clock and the second internal clock.

Multi-phase clock generation circuit

A fuse circuit includes a programming fuse signal generation block configured to generate parity signals, logic levels of which are determined according to addresses selected among a plurality of addresses with a programming enable signal enabled, and generate programming fuse signals which are programmed in response to the programming enable signal, the plurality of addresses and the parity signals; a corrected pulse generation block configured to correct an error included in the programming fuse signals and generate corrected pulses; and a fuse unit configured to generate fuse signals which are reprogrammed according to the corrected pulses.

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Yongin-si, South Korea

Sang Kwon Lee