Skhynix Inc.

Sang Hyun Ku

Duck Hwa Hong

Do Hong Kim

Min Ho Seok

HongJung Kim

So Yoon Kim

Min Su Park

Jae Il Kim

Jaeil Kim

Sung Soo Chi

Seung Han Oak

Don Hyun Choi

A semiconductor device includes a redundancy control signal generation circuit configured to generate a redundancy control signal by determining whether a row address for an active operation has been repaired through a soft post package repair operation and determining whether a row hammer phenomenon has occurred with respect to the row address. The semiconductor device also includes a first selection address generation circuit configured to generate a first selection address for driving a sub word line or a redundancy word line from one of a repair address and a first internal address, based on the redundancy control signal. The semiconductor device further includes a second selection address generation circuit configured to generate a second selection address for driving the sub word line or the redundancy word line from one of a fixed address and a second internal address, based on the redundancy control signal.

Semiconductor devices for controlling refresh operations considering repair operations

A memory device includes a plurality of word lines; and a row control circuit configured to: drive, in response to a precharge command, a selected word line of the word lines such that a voltage level of the selected word line decreases from a first voltage level to a second voltage level during a first section, stays at the second voltage level during a second section and decreases from the second voltage level to a third voltage level during a third section, and keep the second section at a preset time amount, or change the second section to a time amount defined by an input of an active command according to a mode control signal.

Memory device performing precharge operation, and operating method thereof

A memory includes: a plurality of word lines; and a row circuit configured to: activate at least one word line among the word lines to an active voltage level during an active operation and discharge the activated word line during a precharge operation; and discharge the word line from the active voltage level to a precharge voltage level in different manners during the precharge operation in response to a precharge command and during the precharge operation during a refresh operation.

Memory including row circuit and operation method thereof

A semiconductor apparatus includes a first chip that generates a first oscillator signal in response to a detection enable signal and activates a ZQ circuit in response to a ZQ enable signal, and a second chip generates the ZQ enable signal by comparing frequencies of the first oscillator signal and a second oscillator signal with each other in response to the detection enable signal.

Semiconductor apparatus

A semiconductor system includes a first semiconductor device and a first semiconductor device. The first semiconductor device outputs a clock, a chip selection signal and addresses. The second semiconductor device generates a masking signal from the addresses inputted in synchronization with a first pulse of the clock in response to the chip selection signal and decodes internal addresses generated from the addresses inputted in synchronization with a second pulse of the clock to select a word line. The second semiconductor device controls a connection between an address decoder and a fuse circuit in response to the masking signal. The address decoder selects the word line.

Semiconductor device and semiconductor system

A sense amplifier includes a latch type sense unit that detects a voltage difference between a bit line and a bit line bar and causes a voltage difference between a first latch output node and a second latch output node. The sense amplifier further includes a first latch connection unit that electrically connects the bit line to and disconnects the bit line from the first latch output node.

Sense amplifier and semiconductor memory apparatus using the sense amplifier

A semiconductor device includes a counter control signal generation circuit and an access information generation circuit. The counter control signal generation circuit generates a count enablement signal, a reset signal and a count increment signal in response to a first row address selected as a target address and a second row address selected as a neighboring address. The access information generation circuit receives the count enablement signal, the reset signal and the count increment signal to generate a first access information signal including information on the number of times that the target address is selected and a second access information signal including information on the number of times that the neighboring address is selected.

Semiconductor devices

A semiconductor device includes a latch signal generation circuit latching an external signal in synchronization with an internal clock signal to generate a latch signal, a test pulse generation circuit buffering the internal clock signal according to the latch signal to generate a test pulse signal, and a test period signal generation circuit generating a test period signal which is enabled, in response to a pulse of the test pulse signal, to execute a predetermined function.

A semiconductor device includes a flag signal generation circuit and a power-down signal generation circuit. The flag signal generation circuit generates a flag signal which is enabled in response to an operational frequency information signal. The power-down signal generation circuit generates a power-down signal for controlling input of a command in response to the flag signal and a clock enablement signal. A point of time that the power-down signal is generated is adjusted in response to the flag signal.

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Seongnam, South Korea

Sang Hyun Ku