Skhynix Inc.

Sang-Gu Jo

Jung-Hyun Kwon

Sung-Eun Lee

Yong-Ju Kim

Do-Sun Hong

Dong-Gun Kim

Young-Ook Song

Jong-Hyun Park

Hong-Sik Kim

Kyung-min Lee

Yong-Kee Kwon

Jae-Sun Lee

Jing-Zhe Xu

In-Hwa Jung

Ki-Joong Kim

Disclosed is a memory system includes a memory device including a plurality of memory blocks, a write operation management circuit configured to update write operation counts for the plurality of memory blocks, a first block detector configured to detect a hot memory block based on a first operation count value corresponding to the write operation count of a first memory block on which a write operation has been performed among the plurality of memory blocks, a second detector configured to detect a cold memory block based on a second operation count value corresponding to the write operation count of each of second memory blocks adjacent to the first memory block, and a controller configured to copy, if the hot memory block and the cold memory block are detected by the first and second detectors, data of the detected hot memory block or data of the detected cold memory block.

Memory system and operating method of the same

A memory system includes a memory device including one or more memory blocks, and configured to store data in a plurality of pages included in each memory block through a write operation, and a memory controller configured to count an operation number of write operations performed on the memory block, check whether the write operation is performed for each of the pages, select one or more victim pages among the pages, and copy data stored in the victim pages.

Reducing disturbance between adjacent regions of a memory device

A memory device is provided. The memory device includes a plurality of normal memory blocks; and at least two or more bad memory blocks, wherein data having the same number of bits as data to be stored in a normal memory block and a parity code having the number of bits at least twice greater than that of a parity code to be stored in the normal memory block are stored in a first bad memory block and a second bad memory block among the bad memory blocks.

Memory device, memory system, and operation method thereof

A memory controller includes a command input unit suitable for receiving a write command, a read command, and a send command, a command counting unit suitable for performing a counting operation in response to the write command to produce a counted data, a first Error Correction Code (ECC) encoding unit suitable for performing a first ECC encoding onto a data that is read from a memory device in response to the read command to produce a first ECC encoded data, a second ECC encoding unit suitable for performing a second ECC encoding onto the counted data in response to the send command to produce a second ECC encoded data, and a data output unit suitable for combining the first ECC encoded data and the second ECC encoded data to output a read data.

Memory controller, memory system including the same, and operation method thereof

A method for operating a memory device includes: receiving a write command; checking out whether a data strobe signal toggles or not after a given time passes from a moment when the write command is received; when the data strobe signal is checked out to be maintained at a uniform level, detecting voltage levels of a plurality of data pads; and performing an operation that is selected based on the voltage levels of the plurality of the data pads among a plurality of predetermined operations.

Memory device, operating method thereof, and operating method of memory system including the same

A memory system comprises a memory device including a plurality of memory blocks, a write operation check unit configured to count the number of write operations performed on the respective memory blocks, a write count distribution management module configured to manage a distribution of the memory blocks based on the counted number of the write operations, and a wear leveling module configured to detect hot and cold memory blocks from the plurality of memory blocks based on the counted number of the write operation and the distribution, wherein the wear leveling module manages a history of the hot memory block and swaps the hot memory block with the cold memory block according to the managed history.

Memory system and operation method thereof

A memory system includes: a memory device; a cache memory suitable for caching a portion of a data stored in the memory device; and a read voltage controller suitable for controlling a level of a read voltage of the memory device by comparing a cache data in the cache memory with a data from the memory device corresponding to the cache data.

Memory system for controlling read voltage using cached data and operation method of the same

A memory system may include a first memory having a first operating speed, and a second memory having a second operating speed which is different from the first operating speed. A compression device may compress data of the first memory, and may transfer the compressed data to the second memory. The compression device may select a compression scheme among a plurality of compression schemes based on at least one characteristic of the data of the first memory and a data processing combination selected among a plurality of data processing combinations between a series of data processing units of the first memory and a series of data processing units of the second memory, and may compress the data of the first memory according to the selected compression scheme.

Memory system including memories having different characteristics and operation method thereof

An operating method of a memory controller may include determining a physical page to be accessed in a plurality of memory devices by mapping a logical address to a physical address; and determining a distribution pattern in which data of the physical page are distributed to the plurality of memory devices using the logical address.

Memory controller, memory system including the same and operation method of memory controller

A memory system includes a memory device including a memory block, the memory block including a plurality of memory cell groups, an address translator that maps a logical address of a data to a physical address of the memory block, and a controller configured to divide the plurality of memory cell groups into a plurality of first memory cell groups and at least one second memory cell group, and control the address translator so that the address translator maps a logical address of a data to a physical address of the first memory cell groups of the memory block and not in the at least one second memory cell group and switches the at least one second memory cell group with a selected first memory cell group among the plurality of the first memory cell groups when a predetermined period of time elapses.

Memory system and method for wear-leveling by swapping memory cell groups

A memory device may include a memory cell array having a plurality of memory cells, and a controller suitable for reading data of a memory cell corresponding to an address of write data, among the memory cells, and comparing the write data and the read data to check specific bits different from corresponding bits of the read data, among a plurality of bits of the write data, according to a write operation request. The controller may output a check result to outside after a preset time from the write operation request.

Nonvolatile memory device and operating method thereof

An error correcting method of a memory system includes: reading data and an error correction code from a plurality of memory chips; correcting an error of the data based on the error correction code; determining whether or not a miscorrection occurs in the correcting of the error of the data; designating one memory chip among the plurality of the memory chips as a chip-killed memory chip when a miscorrection occurs; re-correcting the error of the data based on the error correction code in consideration of the designated chip-killed memory chip; and re-determining whether a miscorrection occurs in the re-correcting of the error of the data.

Memory system and error correcting method of the same

A memory system includes: a memory device; and a memory controller suitable for controlling the memory device, and the memory device includes: a plurality of normal memory cells; a plurality of redundant memory cells; and a soft repair circuit suitable for replacing a portion of normal memory cells among the plurality of the normal memory cells with the plurality of the redundant memory cells, and the memory controller controls the soft repair circuit to repair the portion of the normal memory cells among the plurality of the normal memory cells with the plurality of the redundant memory cells, commands the memory device to write a secure data in the plurality of the redundant memory cells, and controls the soft repair circuit to recover the repairing of the portion of the normal memory cells with the plurality of the redundant memory cells.

Memory system and method for operating the same

The memory system includes a BCH error correction circuit suitable for generating a BCH error correction code using a first write data which is a portion of a write data from a host, a Hamming error correction circuit suitable for generating a Hamming error correction code using a second write data which is a remaining portion of the write data, a plurality of first memory devices suitable for storing first write data and the BCH error correction code, and one or more second memory devices suitable for storing the second write data and the Hamming error correction code.

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Gyeonggi-do, South Korea

Sang-Gu Jo