Universiteit Antwerpen

Sandra Van Aert

Ivan Pedro Lobato Hoyos

Thomas Friedrich

Jo Verbeeck

Chu-Ping Yu

In a method, for training an artificial neural network (ANN) to reduce noise and/or artefacts in an electron microscopy image, a plurality of training image pairs is generated. For each pair, an undistorted synthetic specimen image and a distorted image are created by simulating additional noise and/or artefact features. The ANN is trained, in which the distorted images are used as input and the corresponding undistorted images as output. An adversarial training strategy is used in which the ANN is trained, as a generator network, in conjunction with concomitantly training a further ANN, as a discriminator network, to differentiate output produced by the generator network from synthetic images in the training set. In training, parameters of the ANN and further ANN are optimized using a generator loss function and a discriminator loss function, in which a dependency exists between said loss functions to train the networks in an adversarial manner.

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Hove, Belgium

Sandra Van Aert