Intel Corporation

Micron Technology Incorporated

Sandeep K Guliani

Kiran Pangal

Mase J Taub

Balaji Srinivasan

Rajesh Sundaram

Raymond W Zeng

Mark E Bauer

Ritesh B Trivedi

Daniel Chu

Davide Mantegazza

Robert L Baltar

Jawad Basit Khan

Robert E Larsen

Peter K Hazen

Chetan Chauhan

Sourabh Dongaonkar

Derchang Kau

Robert N Hasbun

Sanjay S Talreja

Chaohong Hu

Terry L Kendall

Johnny Javanifard

Mariano Tepper

Charles W Brown

Dipanjan Sengupta

Lark-Hoon Leem

John Gorman

Hari M Rao

Ashir G Shah

Collin Ong

Kerry Dean Tedrow

Bo Li

Nathan Franklin

Marc E Landgraf

Chaitanya S Rajguru

Binh N Ngo

William K Waller

Kevin E Arendt

Kedar Mangrulkar

Yasir Mohsin Husain

Terry D West

Ved Pragyan

Xuming Zhao

Balajl Srinivasan

An apparatus, system and method. The apparatus is to be coupled to a memory array of a memory device. The apparatus, in response to a determination of a set command to be implemented on first memory cells of the memory array, is to control an execution of a set pre-read operation on the first memory cells by causing application, by a voltage source, of a first demarcation voltage VDM0 across each of the first memory cells during a set pre-read time period. The apparatus is further to, in response to a determination of a reset command to be implemented on second memory cells of the memory array, control an execution of a reset pre-read operation on the second memory cells by causing application, by the voltage source, of a second demarcation voltage VDM3 across each of the second memory cells during a reset pre-read time period, wherein the set pre-read time period and the reset pre-read time period do not overlap, the voltage source to supply a single voltage value at any given time.

Apparatus, method and system to implement a dual VDM scheme on a three-dimensional memory architecture

A memory accessed by rows and/or by columns in which an array of bits can be physically stored in multi-bit wide columns in physically contiguous rows is provided. A multi-bit wide logical column is arranged diagonally across (M/multi-bits) physical rows and (M/multi-bits) physical columns with each of the plurality of multi-bit wide logical columns in the logical row stored in a different physical row and physical multi-bit column.

Method and apparatus to perform a read of a column in a memory accessible by row and/or by column

A memory device including a memory array and address lines; and decoder circuitry to apply a first bias to a WL coupled to a memory cell selected for a memory operation, a second bias to a BL coupled to the selected memory cell, and one or more neutral biases to the other BLs and WLs of the memory array; wherein the decoder circuitry comprises a plurality of bias circuits coupled to the address lines, a first bias circuit of the plurality of bias circuits comprising a transistor pair and an additional transistor coupled to an address line of the plurality of address lines, wherein the bias circuit is to apply, to the address line, the first bias through the transistor pair in a first state, the second bias through the transistor pair in a second state, and the neutral bias through the additional transistor in a third state.

Bipolar decoder for crosspoint memory

Technologies for column reads for clustered data include a device having a column-addressable memory and circuitry connected to the memory. The column-addressable memory includes multiple dies. The circuitry may be configured to determine multiple die offsets based on a logical column number of the data cluster, determine a base address based on the logical column number, program the dies with the die offsets. The circuitry is further to read logical column data from the column-addressable memory. To read the data, each die adds the corresponding die offset to the base address. The column-addressable memory may include multiple command/address buses. The circuitry may determine a starting address for each of multiple logical columns and issue a column read for each starting address via a corresponding command/address bus. Other embodiments are described and claimed.

Technologies for performant column read operations on clustered data in a dimm architecture

Technologies for media management for providing column data layouts for clustered data include a device having a column-addressable memory and circuitry connected to the memory. The circuitry is configured to store a data cluster of a logical matrix in the column-addressable memory with a column-based format and to read a logical column of the data cluster from the column-addressable memory with a column read operation. Reading the logical column may include reading logical column data diagonally from the column-address memory, including reading from the data cluster and a duplicate copy of the data cluster. Reading the logical column may include reading from multiple complementary logical columns. Reading the logical column may include reading logical column data diagonally with a modulo counter. The column data may bread from a partition of the column-address memory selected based on the logical column number. Other embodiments are described and claimed.

Technologies for column-based data layouts for clustered data systems

A memory decoder enables the selection of a conductor of a row or column of a crosspoint array memory. The decoder includes a circuit to apply a bias voltage to select or deselect the conductor. The conductor can be either a wordline or a bitline. The decoder also includes a select device to selectively provide both high voltage bias and low voltage bias to the circuit to enable the circuit to apply the bias voltage. Thus, a single end device provides either rail to the bias circuit.

Bipolar decoder for crosspoint memory cells

Nonvolatile memory (e.g. phase change memory) devices, systems, and methods that minimize energy expenditure and wear while providing greatly improved error rate with respect to marginal bits are disclosed and described.

Dual demarcation voltage sensing before writes

Apparatuses and methods for accessing a memory cell are described. An example apparatus includes a first voltage circuit coupled to a node and is configured to provide a first voltage to the node and includes a second voltage circuit coupled to a node and is configured to provide a second voltage to the node. A memory cell is coupled to first and second access lines. A decoder circuit is coupled to the node and the first access line, and is configured to selectively couple the first access line to the node. The first voltage circuit is configured to provide the first voltage to the node before the second voltage circuit provides the second voltage to the node, and the second voltage circuit stops providing the second voltage before the node reaches the second voltage.

Apparatuses and methods for accessing memory cells

Threshold switching devices demonstrating transient current protection through both insulation and repair current mechanisms, including associated systems and methods, are provided and discussed.

Transient current-protected threshold switching devices systems and methods

The present disclosure relates to phase change memory control. An apparatus includes a memory controller. The memory controller includes a word line (WL) control module and a bit line (BL) control module. The memory controller is to determine a WL address based, at least in part, on a received memory address. The memory controller is further to determine a BL address. The apparatus further includes a parameter selection module to select a value of a control parameter based, at least in part, on at least one of the WL address and/or the BL address.

Cross point memory control

A system and technique is disclosed for writing data in a cross-point memory. The state of one or more memory cells of the cross-point memory are sensed and then are continued to be selected and left on. It is then determined which of the one or more memory cells are to change state based on incoming user data that is to be written into the one or more memory cells. The one or more memory cells determined to change state and are still selected to be on are then written by applying a write-current pulse to the memory cells. In one exemplary embodiment, the one or more memory cells comprise one or more phase-change-type memory cell devices.

Cross-point memory single-selection write technique

Nonvolatile memory (e.g. phase change memory) devices, systems, and methods of programming the nonvolatile memory including sensing of a snapback current using a set demarcation voltage for set bit mapped cells and a reset demarcation voltage for reset bit mapped cells before selective writes.

In one embodiment, an apparatus comprises read circuitry to apply a read voltage to a three dimensional crosspoint (3DXP) memory cell; and write setback circuitry to apply a first setback pulse having a first magnitude to the 3DXP memory cell in response to the application of the read voltage, wherein applying the first setback pulse comprises bypassing a current mirror that is to limit or control a magnitude of a second setback pulse applied to the 3DXP memory cell when the current mirror is coupled to the 3DXP memory cell.

Method and apparatus for multi-level setback read for three dimensional crosspoint memory

Growing community of inventors

Folsom, CA, United States of America

Sandeep K Guliani