Micromeritics Instrument Corporation

Samuel Varner

Preston Hendrix

Systems and methods for profiling a material property are provided. A plurality of measurement devices can be configured to measure at least a portion of the material property. A controller including at least one processor can be in communication with one or more of the plurality of measurement devices. At least one measurement device of the plurality of measurement devices can measure at least one segment of the material property, and at least one additional measurement device of the plurality of measurement devices can measure at least one additional segment of the material property. The at least one segment and the at least one additional segment can be combined to provide at least a partial profile of the material property.

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Lilburn, GA, United States of America

Samuel Varner