Agere Systems Inc.

Samuel Khoo

Lane Allen Smith

Bernard Lee Morris

John Christopher Kriz

Yasser Ahmed

Robert J Kapuschinsky

Ashok Khandelwal

Disclosed is a system and method for testing a dual mode interface. The dual mode interface includes a first strobe circuit and a second strobe circuit configured to be inoperable during a first operational mode of the interface and operable during a second operational mode of the interface. The dual mode interface also includes a first data circuit and a second data circuit configured to be operable during the first operational mode and the second operational mode. The dual mode interface also includes a signal line connecting an output of the second strobe circuit with an input of the first strobe circuit and a switch element configured to activate said signal line in response to receipt of a test signal.

Method and apparatus for testing a dual mode interface

A buffer circuit is configured to generate an output signal which is a function of an input signal received by the buffer circuit, the buffer circuit being selectively operative in one of at least two modes in response to a control signal. In a first mode, the buffer circuit is configured to provide a low output impedance, characteristic of a digital buffer. In a second mode, the buffer circuit is configured to limit an output current of the buffer circuit. The control signal is indicative of a level of the output signal of the buffer circuit.

Buffer circuit with current limiting

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Macungie, PA, United States of America

Samuel Khoo