Applied Nanostructured Solutions, LLC

Samuel J Markkula

Harry C Malecki

Tushar K Shah

Mark R Alberding

Shawn Kline

John Anthony Hughes

Corey Adam Fleischer

Han Liu

Randy L Gaigler

Brandon K Malet

A quality control system for the manufacture of carbon nanostructure-laden substrates includes a resistance measurement module for continuously measuring resistance of the carbon nanostructure (CNS)-laden substrate.

Resistance measurement system and method of using the same

An apparatus having a composite air-based structure with a first carbon nanotube infused material and a second carbon nanotube infused material. The first and second carbon nanotube infused materials each having a range of carbon nanotube loading selected to provide different functionalities.

CNT-tailored composite air-based structures

An apparatus having a composite sea-based structure with a first carbon nanotube infused material and a second carbon nanotube infused material. The first and second carbon nanotube infused materials each having a range of carbon nanotube loading selected to provide different functionalities.

CNT-tailored composite sea-based structures

Growing community of inventors

Rising Sun, MD, United States of America

Samuel J Markkula