Growing community of inventors

Kanata, Canada

Saman M I Adham

Average Co-Inventor Count = 2.88

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 60

Saman M I AdhamShih-Lien Linus Lu (10 patents)Saman M I AdhamSandeep Kumar Goel (6 patents)Saman M I AdhamAtul Katoch (6 patents)Saman M I AdhamChing-Wei Wu (4 patents)Saman M I AdhamKao-Cheng Lin (4 patents)Saman M I AdhamMing-Hung Chang (4 patents)Saman M I AdhamHao-I Yang (4 patents)Saman M I AdhamVolodymyr Shvydun (4 patents)Saman M I AdhamDonald George Mikan, Jr (4 patents)Saman M I AdhamKun-Hsi Li (4 patents)Saman M I AdhamMing-Chien Tsai (4 patents)Saman M I AdhamTsung-Yung Chang (4 patents)Saman M I AdhamPeter Noel (4 patents)Saman M I AdhamUppu Sharath Chandra (4 patents)Saman M I AdhamChia-En Huang (3 patents)Saman M I AdhamYun-Han Lee (3 patents)Saman M I AdhamMarat Gershoig (3 patents)Saman M I AdhamCormac Michael O'Connell (2 patents)Saman M I AdhamBenoit Nadeau-Dostie (2 patents)Saman M I AdhamRamin Shariat-Yazdi (2 patents)Saman M I AdhamChia-en Huang (1 patent)Saman M I AdhamYun-Han Lee (1 patent)Saman M I AdhamRobert Abbott (1 patent)Saman M I AdhamChao-Jung Hung (1 patent)Saman M I AdhamRamin Yazdi (1 patent)Saman M I AdhamArshak Arshakyan (1 patent)Saman M I AdhamSaman M I Adham (31 patents)Shih-Lien Linus LuShih-Lien Linus Lu (176 patents)Sandeep Kumar GoelSandeep Kumar Goel (96 patents)Atul KatochAtul Katoch (89 patents)Ching-Wei WuChing-Wei Wu (77 patents)Kao-Cheng LinKao-Cheng Lin (45 patents)Ming-Hung ChangMing-Hung Chang (39 patents)Hao-I YangHao-I Yang (30 patents)Volodymyr ShvydunVolodymyr Shvydun (29 patents)Donald George Mikan, JrDonald George Mikan, Jr (29 patents)Kun-Hsi LiKun-Hsi Li (16 patents)Ming-Chien TsaiMing-Chien Tsai (10 patents)Tsung-Yung ChangTsung-Yung Chang (10 patents)Peter NoelPeter Noel (6 patents)Uppu Sharath ChandraUppu Sharath Chandra (5 patents)Chia-En HuangChia-En Huang (156 patents)Yun-Han LeeYun-Han Lee (91 patents)Marat GershoigMarat Gershoig (7 patents)Cormac Michael O'ConnellCormac Michael O'Connell (53 patents)Benoit Nadeau-DostieBenoit Nadeau-Dostie (49 patents)Ramin Shariat-YazdiRamin Shariat-Yazdi (3 patents)Chia-en HuangChia-en Huang (33 patents)Yun-Han LeeYun-Han Lee (14 patents)Robert AbbottRobert Abbott (3 patents)Chao-Jung HungChao-Jung Hung (2 patents)Ramin YazdiRamin Yazdi (1 patent)Arshak ArshakyanArshak Arshakyan (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Taiwan Semiconductor Manufacturing Comp. Ltd. (29 from 40,850 patents)

2. Logicvision, Inc. (2 from 55 patents)


31 patents:

1. 12436858 - Scan synchronous-write-through testing architectures for a memory device

2. 12244741 - Physical unclonable function (PUF) security key generation

3. 11899064 - Scan architecture for interconnect testing in 3D integrated circuits

4. 11856115 - Physical unclonable function (PUF) security key generation

5. 11734142 - Scan synchronous-write-through testing architectures for a memory device

6. 11549984 - Scan architecture for interconnect testing in 3D integrated circuits

7. 11379298 - Memory address protection circuit and method

8. 11256588 - Scan synchronous-write-through testing architectures for a memory device

9. 11210165 - Inter-hamming difference analyzer for memory array and measuring and testing methods for inter-hamming differences of memory array

10. 11050574 - Authentication based on physically unclonable functions

11. 10965475 - Physical unclonable function (PUF) security key generation

12. 10838809 - Memory array and measuring and testing methods for inter-hamming differences of memory array

13. 10740174 - Memory address protection circuit and method

14. 10705934 - Scan synchronous-write-through testing architectures for a memory device

15. 10539617 - Scan architecture for interconnect testing in 3D integrated circuits

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