Taiwan Semiconductor Manufacturing Comp. Ltd.

Saman Adham

Marat Gershoig

Shih-Lien Linus Lu

Yu-Der Chih

Vineet Joshi

Ted Wong

Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro. The output data is generated by the memory macro in response to processing the at least one input vector. The BIST also includes comparing the output data in each of the plurality of cycles with a signature value and determining whether the memory macro is normal or faulty based upon the comparison.

Conducting built-in self-test of memory macro

Disclosed herein is related to physical unclonable function (PUF) with enhanced security based on one time programmable (OTP) memory device. In one aspect, indirection process, hashing or a combination of them can be employed to hide a key for allowing access to an integrated circuit. Each indirection process may include identifying a subsequent address of the OTP memory device based on content stored by the OTP memory device at an address, and obtaining subsequent content stored by the OTP memory device at the subsequent address. Through a number of indirection processes, hidden content stored by the OTP memory device can be obtained. In one approach, hashing can be applied to input bits to obtain an address of the OTP memory device to apply. In one approach, hashing can be applied to the hidden content stored by the OTP memory device to generate the key.

PUF method and structure

Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors. One input vector is transmitted to the memory macro in each of a plurality of cycles. Each of the plurality of input vectors is associated with a bit width. Generating the input vector includes generating a partial input vector of half the bit width and transmitting the partial input vector to each of a first half of the memory macro and a second half of the memory macro. The method also includes receiving, in each of the plurality of cycles, an output data from the memory macro, such that the output data is generated by the memory macro in response to processing the partial input vector, comparing the output data with a signature value, and determining whether the memory macro is normal or faulty based upon the comparison.

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Kanata, Canada

Saman Adham