Divergent Technologies, Inc.

Sam Miller

Lukas Philip Czinger

Eric Paul Monteith

Aron Derecichei

Richard Kingston

Keith Mckay

Jakub Preis

Aspects for implementing 3-D printed metrology feature geometries and detection are disclosed. The apparatus may a measurement device for a 3-D printed component. The component may include a plurality of printed-in metrology features arranged at different feature locations on a surface of the component. The measurement device can be configured to detect the feature locations of the printed-in metrology features and to determine a position or an orientation of the component based on the detected feature locations. In various embodiments, the metrology feature may be a protruding or recessed spherical portion, with the corresponding feature location at the center of the sphere.

Growing community of inventors

Los Angeles, CA, United States of America

Sam Miller