Forza Silicon Corporation

Other

Sam Bagwell

Jonathan Bergey

Loc Truong

David Estrada

Steven Huang

Christophe Ca Basset

Disclosed herein are improved in-pixel correlated double sampling elements for photodetectors. The novel circuits and associated methods of the invention allow for accurate correlated double sampling while avoiding the inherent sampling errors that may occur in prior art in-pixel correlated double sampling techniques when bright or saturating signals are received.

In-pixel correlated double sampling with fold-over detection

A stitched image sensor array on a semiconductor substrate with identical blocks that have wherein said first configuration includes enable inputs, which vary a function of the block depending on the connection to the enable inputs. The enable inputs can set an SRAM to receive different numbers of inputs.

Method for reading out multiple SRAM blocks with different column sizing in stitched CMOS image senor

Provided herein is a novel pixel circuit for image sensors such as IR ROIC image sensors. The design provides a switchable pixel with two modes. In the first mode, the pixel performs in-pixel correlated double sampling to remove reset noise. In the second mode, the pixel is configured in a high-capacity mode to avoid saturation. The pixel may be dynamically switched between modes, for example in response to lighting conditions in the scene to be imaged.

Pixel with switchable high gain and high capacity modes

An image sensor system using a circuit that automatically provides a multiple point output which represents, in a first mode, each of the multiple points receiving outputs at substantially the same time delayed only by a transit time across a wire connecting the multiple point outputs, and in a second mode, each of the multiple points producing outputs that are delayed by a delay time, where each output is delayed relative to each other output by said delay time in the second mode.

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Glendale, CA, United States of America

Sam Bagwell