Stmicroelectronics International N.v.

Stmicroelectronics (Grenoble 2) Sas

Salvador Mir

Richun Fei

Jocelyn Moreau

Matthieu Dubois

Haralampos Stratigopoulos

Testing of control wires of a pixel array of an image sensor is performed by applying a signal transition to a control wire and detecting, based on a voltage signal detected on the control wire, the duration of at least part of the signal transition on the control wire. An electrical fault in the control wire is indicated based on a comparison of the detected duration to a threshold.

Circuit and method for on-chip testing of a pixel array

The invention concerns a sigma-delta switched capacitor analog to digital converter (ADC) having: an input line for receiving a signal to be converted; first, second and third inputs for respectively receiving first, second and third test voltages; and switching circuitry adapted to apply, during a test mode of the sigma-delta ADC, a ternary test signal to the input line by periodically selecting, based on a digital test control signal, one of the first, second or third test voltages to be applied to the input line.

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Saint Hilaire du Touvet, France

Salvador Mir