International Business Machines Corporation

Sally S Botala

Scott Whitney Gould

Brian A Worth

Wendell Ray Larsen

Ronald Raymond Palmer

Wayne Kevin Beebe

Frank Ray Keyser, Iii

Douglas E Sprague

Donald L LaCroix

Randolph P Steel

Frank Ray Keyser Iii

Dale B Grosch

Anthony K Stevens

A method, system and software for automatically generating a test environment for testing a plurality of devices (DUTs) under test in a test system. The multiple devices are tested by mapping the plurality of DUTs into pins of the tester system to create pin data; inputting into a test program generator pattern data, generic test program rules and the pin data; generating a multi-DUT test program and multi-DUT pattern data; and controlling the test system through the test program. The resulting fail data is then logged to each DUT.

Automated multi-device test process and system

A programmable gate array includes test subsystems for testing various functional subsystems of the programmable gate array. A sequence of test methods, employing the test subsystems, test the functionality of the programmable gate array, taking into account the interdependencies of the various subsystems and accordingly enabling fault isolation therein.

Testable programmable gate array and associated LSSD/deterministic test

Growing community of inventors

Colchester, VT, United States of America

Sally S Botala