Silicon Touch Technology Inc.

Materials Analysis Technology Inc.

Sajal Biring

An automatic calculation method for thickness calculation of a deposition layer in a Fin-type field-effect transistor (FinFET) is disclosed through mapping edge lines onto an Excel spreadsheet. The similar method is also applied to the thickness calculation of superlattice or multiple quantum well for a light emitting diode (LED). The edge lines are obtained and transformed from an electronic image taken by Transmission Electron Microscopy (TEM), Focus Ion Beam (FIB), Atomic Force Microscopy (AFM), or X-Ray Diffraction (XRD) of the device.

Dimension calculation method for a semiconductor device

A liquid crystal lens includes a first light-pervious plate, a second light-pervious plate, a first electrode layer arranged on the first light-pervious plate, a second electrode layer arranged on the second light-pervious plate, and a liquid crystal layer sandwiched between the first light-pervious plate and the second light-pervious plate, where the first electrode layer comprises a plurality of concentric electrodes, and a gap between two adjacent outer concentric electrodes is different from a gap between two adjacent inner concentric electrodes.

Growing community of inventors

Hsinchu, Taiwan

Sajal Biring