Nvidia Corporation

Sailendra Chadalavada

Shantanu Sarangi

Milind Bhaiyyasaheb Sonawane

Venkat Abilash Reddy Nerallapally

Bonita Bhaskaran

Tezaswi Raja

Amit D Sanghani

Jue Wu

Mahmut Yilmaz

Anitha Kalva

Jonathon E Colburn

Jae Wu

Suhas Satheesh

Bala Tarun Nelapatla

Ashish Kumar

Animesh Khare

Rahul Garg

Nithin Anil Valentine

Rajendra Kumar reddyS

Rangavajjula Kameswara Naga Mahesh

Kevin Ye

Jayesh Kumar Pandey

Jaison Daniel Kurien

Purnabha Majumder

Sunil Bhavsar

Charlie Hwang

Kevin Zhou

Badrinath Srirangam

Seyed Nima Mozaffari Mojaveri

Kerwin Fu

Milind Sonawane

Sumit Raj

Chen Fang

Abilash Nerallapally

Introduced herein is a technique that reliably measures on-die noise of logic in a chip. The introduced technique places a noise measurement system in partitions of the chip that are expected to cause the most noise. The introduced technique utilizes a continuous free-running clock that feeds functional frequency to the noise measurement circuit throughout the noise measurement scan test. This allows the noise measurement circuit to measure the voltage noise of the logic during a shift phase, which was not possible in the conventional noise measurement method. Also, by being able to measure the voltage noise during a shift phase and hence in both phases of the scan test, the introduced technique can perform a more comprehensive noise measurement not only during ATE testing but as part of IST in the field.

Technique for enabling on-die noise measurement during ate testing and IST

Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.

Asynchronous in-system testing for autonomous systems and applications

Techniques for isolating interfaces while testing a semiconductor device include a semiconductor device having a link interface that couples the semiconductor device to a high-speed data transfer link, a clock control unit that transmits one or more clock signals to the link interface; and a protection module. The protection module asserts a clock stop request to the clock control unit and, in response to receiving a clock stop acknowledgement from the clock control unit, asserts a clamp enable to cause the link interface to be isolated from portions of the semiconductor device. After waiting for a first predetermined period of time to expire, the protection module de-asserts the clock stop request.

Techniques for isolating interfaces while testing semiconductor devices

During functional/normal operation of an integrated circuit including multiple independent processing elements, a selected independent processing element is taken offline and the functionality of the selected independent processing element is then tested while the remaining independent processing elements continue functional operation. To minimize voltage drops resulting from current fluctuations produced by the testing of the processing element, clocks used to synchronize operations within each partition of a processing element are staggered. This varies the toggle rate within each partition of the processing element during the testing of the processing core, thereby reducing the resulting voltage drop. This may also improve test quality within an automated test equipment (ATE) environment.

Performing testing utilizing staggered clocks

Systems and methods enable the updating of tests, test sequences, fault models, and test conditions such as voltage and clock frequencies, over the life cycle of a safety critical application for complex integrated circuits and systems.

On-chip execution of in-system test utilizing a generalized test image

A system for testing complex integrated circuits in the field using updated tests, test sequences, models, and test conditions such as voltage and clock frequencies, over the life cycle of the circuit.

Field adaptable in-system test mechanisms

In one embodiments, a system comprises: a plurality of scan test chains configured to perform test operations at a first clock speed; a central test controller for controlling testing by the scan test chains; and an interface configured to generate instructions to direct central test controller. The interface communicates with the centralized test controller at the first clock speed and an external scan input at a second clock speed. The second clock speed can be faster than the first clock speed. The instructions communicated to the central controller can be directions associated with sequential scan compression/decompression operations. In one exemplary implementation, the interface further comprise a mode state machine used to generate the mode control instructions and a test register state machine that generate test state control instructions, wherein the test mode control instructions and the test state control instructions direct operations of the centralized test controller.

Granular dynamic test systems and methods

Growing community of inventors

Saratoga, CA, United States of America

Sailendra Chadalavada