Pdf Solutions, Incorporated

Said Akar

Jeffrey Drue David

Dennis Ciplickas

John Kibarian

Richard Gene Burch

Brian E Stine

Lin Lee Cheong

Tomonori Honda

Qing Zhu

Michael Keleher

Kenneth Harris

Vaishnavi Reddipalli

Classifying wafers using Collaborative Learning. An initial wafer classification is determined by a rule-based model. A predicted wafer classification is determined by a machine learning model. Multiple users can manually review the classifications to confirm or modify, or to add user classifications. All of the classifications are input to the machine learning model to continuously update its scheme for detection and classification.

Collaborative learning model for semiconductor applications

Growing community of inventors

Miami, FL, United States of America

Said Akar