University of Macau

Sai-Weng Sin

Rui Paulo Da Silva Martins

Seng-Pan U

U-Fat Chio

Yan Zhu

Franco Maloberti

Chi-Hang Chan

He-Gong Wei

Chi-Seng Lam

Man-Chung Wong

Wai-Hei Choi

Li Ding

Biao Wang

Ning-Yi Dai

Yajie Wu

Chi-Kong Wong

Yan-Zheng Yang

An incremental analog-to-digital converter (IADC) with a two-phase linear-exponential accumulation loop for improving the signal to noise distortion ratio (SNDR) and the dynamic range (DR) is disclosed. The linear-exponential IADC includes an analog modulator and a decimation filter. The analog modulator has an input for receiving the analog input voltage and an output. The analog modulator includes an integrator, an adder, a quantizer, a noise-coupling path, a data weighted averaging (DWA) circuit, and a digital-to-analog converter (DAC). The decimation filter has an input for receiving signals from the output of the analog modulator. The decimation filter includes a 1order accumulator, an exponential accumulator, and a decimator. The linear-exponential IADC is configured to operate with a linear phase for suppressing the thermal noise and an exponential phase for boosting the SQNR.

Single-loop linear-exponential multi-bit incremental analog-to-digital converter

A mixed signal controller for a power quality compensator includes an analog circuit, an analog-to-digital converter (ADC), and a digital circuit. The analog circuit amplifies an input signal from the power quality compensator by a gain factor and outputs an analog signal, which is converted to a digital signal by the ADC. The digital circuit receives the digital signal, calculates the reference compensating current of each phase and then generates a trigger signal via hysteresis PWM to the power quality compensator. The digital circuit includes an evaluation circuit that calculates a value of the system total harmonic distortion after the power quality compensator compensates power and adjusts the gain factor when the value of the system total harmonic distortion reaches a predetermined threshold.

Mixed signal controller

A sampling front-end for analog to digital converter is presented that shares a high speed N-bit ADC at front-end and interleaves the pipelined residue amplification with shared amplifier, which achieves high speed, low power and compact area with high density capacitive DAC structure.

Sampling front-end for analog to digital converter

A comparator is provided and the comparator includes a comparing input unit and a latching unit. Wherein, the comparing input unit has a first input receiving a first comparing signal and has a second input receiving a second comparing signal. The comparing input unit drives a first intermediate node signal at a first intermediate node depending on the first comparing signal according to a first strobe signal, and the comparing input unit drives a second intermediate node signal at a second intermediate node depending on the second comparing signal according to the first strobe signal. The latching unit determines a comparing result according to at least one of the first intermediate node signal and the second intermediate node signal. In addition, the latching unit latches the comparing result according to a second strobe signal.

Comparator and calibration thereof

The present invention provides a pipelined-successive approximation register (SAR) analog-to-digital converter (ADC) circuit with decoupled flip-around MDAC, capacitive attenuation solution and self-embedded offset cancellation. The flip-around MDAC architecture is built for low inter-stage gain implementation. A capacitive attenuation solution is provided for minimizing the power dissipation and optimizing conversion speed. The design reuses SAR ADC to perform offset cancellation, which significantly saves calibration area, power and time.

Analog to digital converter circuit

A novel analog-to-digital converter (ADC) system using a two-step conversion is disclosed. The ADC system is capable of achieving high sampling rate, low power consumption and low complexity. The new proposed ADC is formed by cascading a flash ADC having high sampling rate and low resolution with a successive approximation (SA) ADC having low power consumption and low sampling rate.

Cascade analog-to-digital converting system

A delay generator comprises: a current source for supplying a current; a first delay portion, connected to the current source, comprising at least a plurality of inverters and a first capacitor having a first capacitance; and a second delay portion, connected to the current source, comprising at least a plurality of inverters and a second capacitor having a second capacitance, wherein the first capacitance is the same as the second capacitance, wherein the first delay portion generates a first delay by discharging of the first capacitor, wherein the second delay portion generates a second delay by charging of the second capacitor, and wherein the total delay generated by the delay generator is obtained by summation of the first delay and the second delay.

Delay generator

An analog-to-digital converter (ADC) circuit comprising two time-interleaved successive approximation register (SAR) ADCs. Each of the two time-interleaved SAR ADCs comprises a first stage SAR sub-ADC, a residue amplifier, a second stage SAR sub-ADC and a digital error correction logic. The residue amplifier is shared between the time-interleaved paths, has a reduced gain and operates in sub-threshold to achieve power effective design.

Time-interleaved pipelined-SAR analog to digital converter with low power consumption

The present invention provides an n-bits successive approximation register (SAR) analog-to-digital converting (ADC) circuit, comprising: an n-bits SAR control logic, a p-type capacitor network including a DACarray and a sampling capacitor C, an n-type capacitor network including a DACarray and a sampling capacitor C; and a comparator for comparing outputs from the p-type capacitor network and the n-type capacitor network, wherein a power supply and ground are directly connected to the p-type capacitor network and the n-type capacitor network without using reference voltages produced by a reference voltage generator. The n-bits SAR control logic comprises n shift registers, n bit registers, and a switching logic. The comparator comprises a first pre-amplifier, a second pre-amplifier and a dynamic latch. Alternative, the comparator comprises a four-input pre-amplifier and a dynamic latch.

Growing community of inventors

Macau, China

Sai-Weng Sin