Kabushiki Kaisha Toshiba

Toshiba Memory Corporation

Sai Prem Kumar Ayyagari

Takeichiro Nishikawa

Topon Kumar Paul

Shigeru Maya

Arun Kumar Kalakanti

A method and system for detecting anomalies in waveforms in an industrial plant. During a learning stage, one or more training waveforms are received from sensors monitoring a plurality of equipment in the industrial plant. The one or more training waveforms are used to generate a representative waveform and deviations of the one or more training waveforms from the representative waveform are determined. Based on the deviations, groups are created. A model may be associated with each group for building an expected waveform pattern. When test waveforms are received, based on the electrical and physical properties of the test waveforms, each test waveform is classified into one of the groups. Thereafter, each waveform is compared with the expected waveform pattern associated with the group to which the respective test waveform belongs, to detect the anomaly.

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Karnataka, India

Sai Prem Kumar Ayyagari