Avago Technologies General IP (singapore) Pte. Ltd.

Sahilpreet Singh

Rajiv Kumar Roy

Disha Singh

Anjana Das

A memory cell having integrated read and write assist functionality includes a storage element and first and second switching circuits. The first switching circuit is configured to selectively couple a first internal storage node of the storage element with a first bit line. The second switching circuit is configured to selectively couple a second internal storage node of the storage element with a second bit line. During a read operation, at least one of the first and second switching circuits is configured to increase a switching threshold of at least one inverter in the storage element. During a write operation, at least one of the first and second switching circuits is configured such that ground bounce associated with at least one of the first and second switching circuits assists in writing a logical state of the memory cell.

Memory cell having built-in read and write assist

A Read Only Memory (ROM) and method for providing a high operational speed with reduced leakage, no core cell standby leakage, and low power consumption. The source of the ROM cell (NMOS) is connected to a virtual ground line (VNGD) instead of VSS. Thus, the ROM cell can be operatively coupled to the bit-line, the word-line, and the virtual ground, which also acts as a column select signal. The arrangement of the ROM is such that the virtual ground of the selected column is pulled down to a ground voltage. Non-selected columns virtual ground can be maintained at a supply voltage to ensure that unwanted columns will not have any sub-threshold current (as Vds=0). Since no pre-charging of bit-line comes in the access time path, the ROM achieves a high operational speed with reduced leakage and low power consumption.

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Bengaluru, India

Sahilpreet Singh