International Business Machines Corporation

Taiwan Semiconductor Manufacturing Comp. Ltd.

Sagarika Mukesh

Ruilong Xie

Devika Sarkar Grant

Timothy Mathew Philip

Fee Li Lie

Kisik Choi

Hosadurga K Shobha

John Christopher Arnold

Dominik Metzler

Nicolas J Loubet

Julien Frougier

Ashim Dutta

Nikhil Jain

Prabudhya Roy Chowdhury

Veeraraghavan S Basker

Jingyun Zhang

John S Werner

Andrew Mark Greene

Arkadiy O Tsfasman

Somnath Ghosh

Thamarai Selvi Devarajan

Alexander Reznicek

Devendra K Sadana

Brent A Anderson

Effendi Leobandung

Junli Wang

Steven J Holmes

Chanro Park

Dechao Guo

Balasubramanian Pranatharthiharan

Ruqiang Bao

Robert Russell Robison

Nicholas Anthony Lanzillo

Huiming Bu

Albert Manhee Chu

Kamal Kumar Sikka

Gauri V Karve

Anthony I Chou

Albert M Young

Tao Li

Tsung-Sheng Kang

Youngseok Kim

Kai Zhao

Liqiao Qin

Shravan Kumar Matham

Aakrati Jain

Dong Hyun Kim

A microcooler device and formation thereof. The microcooler device includes: a first set of fins having a first fin width; a second set of fins having a second fin width, wherein the first set of fins alternate between the second set of fins; and a set of channels located between the first set of fins and the second set of fins.

Double patterned microcooler having alternating fin widths

A semiconductor structure is provided that includes a first FET device region including a plurality of first FETs, each first FET of the plurality of first FETs includes a first source/drain region located on each side of a functional gate structure. A second FET device region is stacked above the first FET device region and includes a plurality of second FETs, each second FET of the plurality of second FETs includes a second source/drain region located on each side of a functional gate structure. The structure further includes at least one first front side contact placeholder structure located adjacent to one of the first source/drain regions of at least one the first FETs, and at least one second front side contact placeholder structure located adjacent to at least one of the second source/drain regions of at one of the second FETs.

Stacked FETS with contact placeholder structures

Embodiments are disclosed for a semiconductor structure. The semiconductor structure includes a first pair of field effect transistors (FETs). Additionally, the semiconductor structure includes a second pair of FETs. Further, the semiconductor structure includes a shallow gate cut that separates a first pair of gates, a first pair of channels, and a first pair of source/drain (S/D) epitaxies of the first pair of FETs. Additionally, the first pair of S/D epitaxies are wired to a backside power rail (BPR) by a backside contact. Further, the semiconductor structure includes a deep gate cut that separates a second pair of S/D epitaxies of the second pair of FETs. Additionally, one of the second pair of S/D epitaxies is wired to a back end of line (BEOL) interconnect via a frontside contact. Further, another of the second pair of S/D epitaxies is wired to the BPR by a backside contact.

Forksheet transistor with dual depth late cell boundary cut

According to the embodiment of the present invention, a semiconductor device includes a first source/drain and a second source/drain. A first source/drain contact includes a first portion and a second portion. The first portion of the first source/drain contact is located directly atop the first source/drain. The second portion of the first source/drain contact extends vertically past the first source/drain. The first source/drain is in direct contact with three different sides of a first section of the second portion of the first source/drain contact.

Via to backside power rail through active region

One or more systems, devices and/or methods provided herein relate to a circuit device having a modular or selectively designed interconnect structure with a plurality of conformal features. In the semiconductor realm, such achievements can allow for fabrication of a device with sub 18 nanometer (nm) or lesser pitch between adjacent and/or parallel lines of the interconnect structure. A device can comprise a semiconductor device having an interconnect structure having a first set of parallel lines and a second set of parallel lines, where the lines of the first set can be arranged in a transverse direction to the lines of the second set. The lines of the first set can be disposed orthogonally to the lines of the second set. The first second sets of lines can comprise first and second rounded jogs that are conformal to one another and which connect the first set of lines to the second set of lines.

Circuit interconnect structure

Embodiments herein include semiconductor structures with a first source/drain (S/D) connected to a first field-effect transistor (FET) region, a second S/D connected to a second FET region, and a buried power rail (BPR) region. The BPR region may include a BPR, a first dielectric liner lining a first lateral side of the BPR region, and a second dielectric liner lining a second lateral side. The first dielectric liner isolates the BPR from the first FET region and the first S/D, and the second dielectric liner isolates the BPR from the second FET region. Embodiments may also include a contact electrically connecting the second S/D and the BPR through a second lateral side of the BPR region. The liners enable the BPR to be formed after the formation of gates and the S/Ds, so that the BPR does not cause problems during annealing processes of the gates and the S/Ds.

Buried power rail after replacement metal gate

A back-end-of-line (BEOL) component includes a substrate and a first layer of dielectric material arranged on the substrate. The first layer of dielectric material includes openings. The BEOL component further includes a first layer of metal material arranged in the openings. The BEOL component further includes an etch stop layer arranged on top of the first layer of dielectric material. The BEOL component further includes a second layer of metal material in direct contact with the first layer of metal material. The second layer of metal material includes at least one projection extending above the etch stop layer. The BEOL component further includes a second layer of dielectric material arranged on top of the etch stop layer and surrounding the at least one projection.

Multilayer dielectric stack for damascene top-via integration

A semiconductor structure may include one or more nanosheet field-effect transistors formed on a first portion of a substrate, and one or more fin field-effect transistors formed on a second portion of the substrate. A source drain of the one or more nanosheet field-effect transistors or a gate of the one or more nanosheet field-effect transistors may be separated from the substrate by an isolation layer. A source drain of the one or more fin field-effect transistors or a gate of the one or more fin field-effect transistors may be in direct contact with the substrate. The semiconductor structure may include a gate spacer surrounding the gate of the one or more nanosheet field-effect transistors and the gate of the one or more fin field-effect transistors.

Gate-all-around nanosheet field effect transistor integrated with fin field effect transistor

A device comprises a first interconnect structure, a second interconnect structure, a first cell comprising a first transistor, a second cell comprising a second transistor, a first contact connecting a source/drain element of the first transistor to the first interconnect structure, and second contact connecting a source/drain element of the second transistor to the second interconnect structure. The first cell is disposed adjacent to the second cell with the first transistor disposed adjacent to the second transistor. The first and second cells are disposed between the first and second interconnect structures.

Backside power rails and power distribution network for density scaling

Methods and structures for forming vias are provided. The method includes forming a structure that includes an odd line hardmask and an even line hardmask. The odd line hardmask and the even line hardmask include different hardmask materials that have different etch selectivity with respect to each other. The method includes patterning vias separately into the odd line hardmask and the even line hardmask based on the different etch selectivity of the different hardmask materials. The method also includes forming via plugs at the vias. The method includes cutting even line cuts and odd line cuts into the structure. The even line cuts and the odd line cuts are self-aligned with the vias. The vias are formed at line ends of the structure.

Selective patterning of vias with hardmasks

Provided is a semiconductor device. The semiconductor device comprises a transistor comprising a plurality of source/drain epitaxies. The semiconductor device further comprises at least one backside power rail under the transistor. The semiconductor device further comprises a backside inter-layer dielectric (ILD) located between the plurality of source/drain epitaxies and the at least one power rail. The semiconductor device further comprises a first backside contact connecting a first source/drain epitaxy to the at least one backside power rail. The semiconductor device further comprises one or more contact placeholders formed under the other source/drain epitaxies.

Self-aligned backside contact integration for transistors

Some implementations described herein provide apparatuses and techniques for correcting a network disruption during a virtual meeting. In response to detecting audio and/or video input to a first device, audio and/or video data is recorded and stored in a temporary buffer of the first device. After the network disruption, and using time stamps, a network disruption server may request the audio and/or video data from the first device and transmit the audio and/or video data to a second device at an accelerated rate.

Correcting disruption of a network during a virtual meeting

A semiconductor component includes an area of dielectric material extending below an uppermost surface of a substrate. The semiconductor component further includes a trench formed so as to extend from above the uppermost surface of the substrate into the area of dielectric material. The semiconductor component further includes a non-metal liner coating interior surfaces of the trench. The semiconductor component further includes a metal liner coating interior surfaces of the non-metal liner. The semiconductor component further includes a power rail formed in the trench in direct contact with at least one of the metal liner or the non-metal liner such that the power rail extends into the area of dielectric material and above the uppermost surface of the substrate.

High aspect ratio buried power rail metallization

A semiconductor device includes a bottom device, a top device, and a spacer. The bottom device includes a first set of silicon sheets and a first source-drain epitaxy in direct contact with the first set of silicon sheets. The top device includes a second set of silicon sheets, a set of separation layers, and a second source-drain epitaxy. Each silicon sheet of the second set of silicon sheets is separated by a separation layer of the set of separation layers. The second source-drain epitaxy is arranged in direct contact with the second set of silicon sheets. The spacer is arranged between the first source-drain epitaxy and the second source-drain epitaxy and is arranged between each silicon sheet of the second set of silicon sheets.

Dual inner spacer epitaxy in monolithic stacked FETs

Stream alterations under limited bandwidth conditions is provided. A router on a local network continuously monitors incoming network traffic from a source external to the local network to detect that a bandwidth of the incoming network traffic exceeds a first threshold. The router sends a request to a source of the incoming network traffic to temporarily redirect the incoming network traffic to an optimization analyzer. Analysis is performed on the incoming streams to identify one or more streams for alteration. In response to identifying one or more of the incoming streams for alteration, for each identified incoming stream, continuously altering the identified incoming stream, and re-directing the altered stream to the local device.

Stream alterations under limited bandwidth conditions

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Albany, NY, United States of America

Sagarika Mukesh