Cadence Design Systems, Inc.

Aqua Creek Products LLC

Sagar Kumar

Vivek Chickermane

Hitesh Mohan Kumar

Rajesh Khurana

Ankur Gupta

Vikas Kohli

Matthew Timothy Bromley

Divyank Mittal

Scott Shakespeare

Kyle Roth

Evan Albert Francis

Methods and systems are provided for testing three-dimensional (3D) stacked dies of integrated circuits (ICs). The methods and systems receive, by test signal routing logic implemented on a first die, a first die test signal, the test signal routing logic operating in an elevate mode or turn mode. The methods and systems receive a second die test signal from a second die and route the first die test signal to an external device in the turn mode. The methods and systems route the second die test signal received from the second die to the external device in the elevate mode.

3D stacked die testing structure

An IC chip test engine selects an instrument of an IC design based on an instrument access script, wherein the selected instrument comprises an IP block and a test data register (TDR) logically arranged upstream from the IP block. The IC chip test engine can also identify a set of SIBs gating access to the selected instrument and select a scan chain for operating the set of SIBs to control access to the selected instrument. The IC chip test engine augments the scan chain with data to cause at least a furthest downstream SIB of the set of SIBs that gates access to the selected instrument to transition to an opened state. The IC chip test engine can generate a set of load vectors for the scan chain to load the TDR of the selected instrument with data to apply a respective test pattern to the IP block.

IC chip test engine

A manipulator arm for moving a load from a first position at a first elevation, to a second position at a second elevation, provides a base and defines plural spaced apart axle holes. A fulcrum lever link formed of a channel beam defines plural spaced apart axle holes. A first load member, and two support members extend between, and pivotally interconnect, the base plate and the fulcrum lever link and define a quadrilateral lift frame about the pivotal interconnections. An actuator operatively communicates between the first load member and the fulcrum lever link and the fulcrum lever link provides mechanical advantage to the actuator to cause the quadrilateral lift frame to change from a first configuration at the first position to a second configuration at the second position.

Mechanical manipulator arm

The present disclosure relates to a computer-implemented method for electronic design automation. Embodiments may include storing one or more electronic circuit designs at an electronic circuit design database and receiving a user input associated with one of the electronic circuit designs. Embodiments may include scanning the one or more stored electronic circuit designs and generating a network including a relationship graph and a component map, based upon, at least in part, the scanning Embodiments may include generating at least one next neighbor component based upon, at least in part, the network and the received user input. Embodiments may include displaying one or more user-selectable options at a graphical user interface, wherein the user-selectable options include the at least one next neighbor component.

System and method for suggesting components associated with an electronic design

The present disclosure relates to a computer-implemented method for electronic design automation. The method may include providing, using one or more processors, an electronic design and visually displaying a plurality of possible route sets associated with the electronic design at a graphical user interface. The method may include providing an option to select between the plurality of possible route sets at the graphical user interface.

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Uttar Pradesh, India

Sagar Kumar