University System of Maryland

Other

Saeed Pilevar

Christopher C Davis

Walid A Atia

Frank H Portugal

Alexander J Fielding

Klaus Edinger

Igor I Smolyaninov

A method of forming a fiber probe having an aperture for use in near-field scanning optical microscopy. The method includes a first steps of coating an optical fiber having a tapered tip with a metal layer. Next is a step of milling the tapered tip and metal layer such that an aperture is formed through the metal layer at the tapered tip. The milling step includes focused ion-beam milling the tapered tip and metal layer. The focused ion-beam milling can be done by raster scanning the focused ion-beam in a rectangular pattern at an apex of the tapered tip. Also, the fiber probe made through the above outlined method is used in near-field scanning optical microscopy.

Focused ion-beam fabrication of fiber probes for use in near field scanning optical microscopy

An optical fiber is tapered, preferably adiabatically, and has a material coated on it for chemical bonding with fluorophores. When the fluorophores couple with the material, evanescent radiation generated fibers causes the fluorophores to fluoresce, and the fluorescence is coupled back into the fiber.

Optical fiber evanescent field excited fluorosensor and method of manufacture

Optical fiber evanescent field excited fluorosensor and method of

A probe includes first and second single-mode optical fibers with a semi-reflecting mirror between them. The second optical fiber is tapered by heating and pulling. The semi-reflecting mirror, the tapered portion, and the sample form a Fabry-Perot cavity. The probe can be used in a system having a differential interferometer which provides the appropriate path difference with a mirror on a piezoelectric transducer.

Near field optical probe for simultaneous phase and enhanced amplitude

Growing community of inventors

Gaithersburg, MD, United States of America

Saeed Pilevar