Samsung Electronics Co., Ltd.

California Institute of Technology

Sadegh Faraji-Dana

Duhyun Lee

Andrei Faraon

Chanwook Baik

Yu Horie

Ehsan Arbabi

Mahsa Seyedeh Kamali

A polarimeter for measuring a polarization rotation caused by a measurement object is provided, the polarimeter including an optically active material. The polarimeter includes a light source unit for irradiating a measurement object with light having a specific polarization; an anisotropic meta surface element for splitting reaction light, obtained by reacting the light of the specific polarization irradiated by the light source unit with the measurement object, into first and second reaction light; and a detection unit for detecting the first and second reaction light separated by the anisotropic meta surface element according to polarization. The polarization rotation caused by the measurement object may be calculated by comparing detection signals of the first and second reaction light detected by the detection unit.

Polarimeter for detecting polarization rotation

Growing community of inventors

Pasadena, CA, United States of America

Sadegh Faraji-Dana