Mitutoyo Corporation

Other

Mitutoyo Mfg. Co., Ltd.

Mitutoyo Mfg.

Sadayuki Matsumiya

Shigeru Ohtani

Yoshiro Asano

Yu Sugai

Kazuo Yamazaki

Yasushi Fukaya

Kenji Iwamoto

Masanori Arai

Atsuya Niwano

Naoki Morita

Tomoyuki Miyazaki

Shuichi Kamiyama

Kenji Okabe

Hidemitsu Asano

Fumihiko Koshimizu

Nobuyuki Hama

Masaru Kawazoe

Kazuhiko Hidaka

Shuji Hayashida

Koichi Komatsu

Susumu Yoshioka

Jun Odake

Kazuhiko Kimura

Masayoshi Uneme

Osamu Saito

Tatsuya Nagahama

Shozaburo Tsuji

Yoshiaki Shiraishi

Ryohei Kanno

Kotaro Hirano

Atsushi Hattori

Takaharu Imura

Kenji Abiko

Shinichiro Aoyagi

Takeshi Kawabata

Kouji Sasaki

Shuuji Hayashida

Masato Kon

Yasushi Fukumoto

Hirokazu Michiwaki

Hitoshi Isobe

Keiji Yamada

Kouichi Arai

Takao Kawabe

Takashi Gohma

Kyoichi Yamamoto

Takamasa Shigeno

Takeshi Yamamoto

Nobuyuki Hayashi

Mikio Suzuki

Makoto Fujishima

Hideyuki Arai

Koji Kubo

Masaoki Yamagata

Kentaro Nemoto

Hiroshi Sakai

Shiro Igasaki

Tatsuki Nakayama

Yoshiyuki Omori

Tsukasa Kojima

Fumihiro Takemura

Atsushi Shimaoka

Aki Hiroshima

Seiji Shimokawa

Hidekazu Sano

Tadao Nakaya

Atsushi Usami

Yuwu Zhang

Hirohisa Handa

Yasuhiro Tsujimoto

Yukiji Yoda

Masaki Okayasu

Hiromu Maie

Ken Motohashi

Toshiyuki Tamai

Junji Sakurada

Nobuya Kaneko

Yoshikazu Ooyama

Shunsaku Tachibana

Toshihisa Takai

Yuji Oura

Takafumi Kano

Kazushi Noguchi

Hirato Sonobe

Sadaharu Arita

Shigeo Miyamoto

Yoshifumi Saito

Yoshihiko Takahashi

Masao Kanamoto

Yukio Mawake

Yu Kawakubo

Hiroshi Hanaoka

Yasunori Mori

Nobuyuki Nakazawa

Masanori Seki

Yasuo Sugita

Hayato Kusama

Hitoshi Ohta

Yukio Yatabe

Dahai Yu

When generating a tomographic image using a measuring X-ray CT apparatus that is configured to emit X-rays while rotating a specimen that is arranged on a rotary table and reconstruct a projection image thereof to generate a tomographic image of the specimen, an amount of geometric error that is included in the projection image is obtained in advance and stored; the projection image is corrected using the stored amount of geometric error; and a tomographic image is reconstructed using the corrected projection image.

Measuring X-ray CT apparatus and tomographic image generating method

A measuring head includes a first slide mechanism for a first measurement axis provided to be detachable to external moving devices; a second slide mechanism for a second measurement axis held to be movable by the first slide mechanism; a third slide mechanism for a third measurement axis held to be movable by the second slide mechanism; a probe held to be movable by the third slide mechanism; pneumatic cylinders for connecting slider parts and guide parts included in each slide mechanism; and automatic pressure regulators for respectively changing air pressures supplied to each pneumatic cylinder in accordance with measurement postures of the measuring head.

Measuring head

Display device for hardness tester

Hardness tester

A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement sensor in a Z axis direction orthogonal to the XY plane and bringing the measurement sensor to face the interior wall; a W axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a &#x3b8; axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.

Surface texture measuring apparatus

A chromatic confocal sensor includes a light source portion that emits a plurality of light beams having different wavelengths; an objective lens that converges the plurality of light beams at different focal positions; an emission port from which measurement light reflected by an object to be measured at the focal positions out of the plurality of light beams is emitted; a position calculation portion that calculates a position of the object to be measured based on the emitted measurement light; an observation portion including an observation light source that emits observation light and an image sensor; and a beam splitter that emits at least a part of the measurement light that passes through the objective lens to the emission port and emits at least a part of the observation light that passes through the objective lens and is reflected by the object to be measured to the image sensor.

Chromatic confocal sensor

An XY shift mechanism can shift a rotary table in a two-dimensional direction (XY direction) orthogonal to a rotation axis of the rotary table. By collaborative control of the shift position of the rotary table in the two-dimensional direction in synchronization with the rotation of the rotary table, rotation is made possible about a virtual rotation center that is set at an arbitrary position on the rotary table. The collaborative control of the shift position of the rotary table in the two-dimensional direction also corrects rotation eccentricity owing to the eccentricity of the rotary table. Thus, the virtual rotation center can be set at an arbitrary position on the rotary table, thus enabling obtainment of high resolution tomographic images of a plurality of regions of interest of an object, without the need for repositioning of the object.

Method and device for controlling rotary table

A measuring probe for measuring a screw groove of a relatively movable ball screw includes a light source, an objective lens formed to correspond to the screw groove of the ball screw, arranged to be opposed to the screw groove of the ball screw in a non-contact manner, and configured to emit light from the light source to the screw groove of the ball screw, and a line sensor configured to detect an interference pattern generated by reflected light from the screw groove of the ball screw and reflected light on a surface of the objective lens. This enables high-accuracy measurement of a specified area of a shape of a side surface of a relatively movable work in a non-contact manner.

Measuring probe and measuring probe system

A probe head rotation mechanism, situated between a spindle and a probe of a coordinate measurement device, includes: a main body frame supported by the spindle; a rotor supported by the main body frame so as to be capable of tilting with respect to an axial center of the spindle; the main body frame; and a motor supported by the main body frame and driving the rotor. A motor main body is arranged away from lying on the axial center of the spindle, and an axial center of the motor is oriented outward in a diameter direction of the spindle.

Probe head rotating mechanism

Variable focal length lens

Probe for remote coordinate measuring machine

Growing community of inventors

Kawasaki, Japan

Sadayuki Matsumiya