Infineon Technologies Ag

Infineon Technology Ag

Sabine Kieser

Stefan Dietrich

Christian Weis

Peter Schroegmeier

Thomas Hein

Michael Bernhard Sommer

Patrick Heyne

Torsten Partsch

Thilo Marx

Peter Schr&ouml;gmeier

Pramod Acharya

Michael Markert

Peter Schrögmeier

Martin Brox

Helmut Schneider

Russell J Houghton

Acharya Pramod

A semiconductor memory having at least one memory cell adapted to store a data value, and adapted to be connected to a data line through a switch device controlled by a control signal. The invention also relates to a tri-state driver device for driving the control signal. Further, there is a method for operating a memory, in which the memory has a memory cell adapted to store a data value, and adapted to be connected to a data line through a switch device controlled by a control signal.

Semiconductor memory having tri-state driver device

Data transfer is effected on an internal and/or on an external transfer path with or in a semiconductor component, such as a semiconductor memory. A first multiplexer/demultiplexer codes a data sequence by defining a current level and a voltage level for a data signal. The coded sequence is then transferred on the transfer path synchronously with a clock signal and is decoded in a second multiplexer/demultiplexer by evaluation of the received current level and of the received voltage level. From this, the transferred data sequence is determined.

Method and device for data transfer

An integrated memory has row lines, column lines and column selection lines for activating read/write amplifiers. In each case, one group of a predetermined number of memory cells belongs to a row and a column address. Furthermore, the memory has a number of connecting pads corresponding to the predetermined number. Each memory cell in a group of memory cells is associated with one of the connecting pads. A control circuit for controlling the memory access is designed and can be operated such that, with a column address, it activates at least two different column selection lines. One of the column selection lines is activated for two or more column addresses. The delay times and the line lengths on the memory chip can thus be reduced in size.

Integrated memory, and a method of operating an integrated memory

Latency time circuit for an S-DRAM, which is clocked by a high-frequency clock signal for producing a delayed data enable control signal for synchronous data transfer through a data path of the S-DRAM, having at least one controllable latency time generator for delaying a decoded data enable control signal with an adjustable latency time, characterized by at least one comparison circuit, which compares the cycle time of the high-frequency clock signal with a predetermined decoding time and by a signal delay circuit which can be switched on by means of the comparison circuit in order to delay the decoded data enable control signal with a predetermined delay time, in which the signal delay circuit is switched on by the comparison circuit when the cycle time of the clock signal is in a limit time region which is located about the predetermined decoding time.

Latency time circuit for an S-DRAM

Latency time circuit for an S-DRAM ( ), which is clocked by a high-frequency clock signal (CLK), for producing a delayed data enable signal for synchronous data transfer through a data path ( ) of the S-DRAM ( ), having a controllable latency time generator ( ) for delaying a decoded external data enable signal (PAR) with an adjustable latency time, which a comparison circuit ( ) which compares a cycle time (t ) of the high-frequency clock signal (CLK) with a predetermined signal delay time of the data path ( ), and reduces the latency time of the latency time generator ( ) by the cycle time if the signal delay time of the data path ( ) is greater than the cycle time (t ) of the clock signal (CLK)

Latency time switch for an S-DRAM

DDR memory and storage method

Control circuit for a data path of an S-DRAM which is clocked by a high-frequency clock signal, having a programmable mode register for storing a latency value; a latency generator for temporally delaying a data path control signal, generated by an internal sequence controller, with a switchable latency; a latency decoder, which switches the latency generator in a manner dependent on the latency value stored in the mode register, provision being made of at least one signal delay element, which can be switched in by the latency decoder and serves for the signal delay of the data path control signal with a specific delay time, the latency decoder switching in the associated signal delay element if the stored latency value is high.

Control circuit for an S-DRAM

Integrated circuits, in particular memory chips of the DDR SDRAM type, are tested in a parallel manner. In order to prevent the circuits from being driven relative to one another during a test operation, an input terminal that is already connected to a channel of an automatic test machine anyway is connected to a switching device, by which the output drivers can be turned off in a manner dependent on the control signal that can be fed in at the input terminal. The switching device preferably contains a demultiplexer and also a multiplexer. The demultiplexer can be driven by a test control signal that is additionally generated besides the test control signal. The input terminal is connected to a tester channel anyway during test operation, with the result that no additional external outlay arises.

Integrated circuit having a test operating mode and method for testing a multiplicity of such circuits

The circuit configuration has a memory array, a memory access controller, a control unit, and an input/output circuit. The control unit outputs a control signal simultaneously to the memory access controller and to the input/output circuit. When the control signal is received, the input/output circuit outputs data to the memory access controller via the data bus. When the control signal is received, the memory access controller stores the data present on the data bus in memory cells of the memory array. Owing to different geometric arrangements and different electrical capacitances, differences in propagation time of the control signals may occur on the path from the control unit to the memory access controller and from the control unit to the input/output circuit. For this purpose, a delay circuit or delay line is provided on the signal path to the memory access controller which brings about a delay of the control signal. This enables precise synchronization of the writing of data into the memory array.

Circuit configuration with a memory array

The voltage pump for generating a boosted output voltage has a switch-on control circuit. The switch-on control includes a transistor that is connected between a terminal for feeding in a supply voltage and the terminal for tapping off the boosted output voltage. After the voltage pump has started to operate, the boosted output voltage is decoupled from the supply voltage by the transistor. A changeover switch forwards the respective higher of the output voltage or supply voltage to the substrate terminal and gate terminal of the transistor. The switch-on control enables early provision of a boosted output voltage in conjunction with reliable start-up operation of the voltage pump, while the additional outlay on circuitry is minimized.

Voltage pump with switch-on control

An integrated memory is described which has a memory cell array with column lines and row lines. A row access controller serves for activating one of the row lines and for controlling a deactivation operation. An input of a control unit is connected to a signal terminal for a signal that, in the event of a read access to one of the memory cells, defines the beginning of data outputting to a point outside the memory cell array. The data output is synchronized with a clock signal. In this case, the signal is adjustable depending on an operating frequency of the memory. An output signal of the control unit serves for triggering the deactivation operation of one of the row lines after a write access. Therefore, in the event of a write access, a comparatively high data throughput is possible even at different operating frequencies of the integrated memory.

Growing community of inventors

Hausham, Germany

Sabine Kieser