Waymo LLC

Sabareeshkumar Ravikumar

Shishuang Sun

Feng Wang

Ji Zhang

Daniel L Rosenband

Pierre-yves Droz

Pieter Kapsenberg

Darren Xinhang Chen

Darren Chen

Example embodiments relate to methods of increasing a temperature of a computer module to start the computer at environmental temperatures below a threshold temperature. An example embodiment includes receiving, at one or more computing components thermally coupled to a main computer via a liquid-cooled plate, a set of program instructions. The method can also include running the set of program instructions on at least one computing component. Running the set of program instructions on the computing component can generate heat that flows to the main computer via the liquid-cooled plate. The method can additionally include detecting, from at least one thermal sensor coupled to the liquid-cooled plate, a temperature reading indicative of a temperature of the main computer. The method can further include determining that the temperature reading has reached a predetermined temperature threshold and based on the temperature reading reaching the predetermined temperature threshold, powering on the main computer.

Method of temperature conditioning compute module for cold start

An optical receiver may include a plurality of photodetectors, a common processed data pipeline, and a plurality of processors. Outputs of the plurality of processors are communicatively coupled to the common processed data pipeline. Each processor is configured to accept input signals from a respective photodetector of the plurality of photodetectors. Each processor is also configured to process the input signals to provide processed data and output the processed data into a data stream of the common processed data pipeline according to one or more predetermined data locations. A method for using the optical receiver and a non-transitory computer readable medium are also described.

Multi-chip daisychain for output aggregation

One example system for preventing data loss during memory blackout events comprises a memory device, a sensor, and a controller operably coupled to the memory device and the sensor. The controller is configured to perform one or more operations that coordinate at least one memory blackout event of the memory device and at least one data transmission of the sensor.

Control calibration timing to avoid memory write blackout period

One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.

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Sunnyvale, CA, United States of America

Sabareeshkumar Ravikumar