Augury Systems Ltd.

Saar Yoskovitz

Gal Shaul

Ori Negri

Gal Ben-Haim

Eduard Rudyk

Daniel Barsky

Christopher Bethel

A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.

Systems and methods for acoustic emission monitoring of semiconductor devices

A method for machine monitoring including causing a first sensor to acquire at least a first non-stationary signal from at least one machine operating in a non-stationary manner during at least one operational time frame, causing a second sensor to acquire at least a second non-stationary signal from the at least one machine during the operational time frame, fusing a first non-stationary output provided by the first sensor with a second non-stationary output provided by the second sensor, extracting at least one feature from the fused output, analyzing the at least one feature to ascertain a state of health of the at least one machine and performing at least one operation on the at least one machine based on the state of health as found by the analyzing.

Automated analysis of non-stationary machine performance

A system for continuously monitoring at least one machine including at least one magnetic sensor sensing magnetic fields emitted by at least one machine, at least one vibration sensor synchronously sensing vibrations emitted by the at least one machine, a signal analyzer receiving at least a portion of the magnetic field emission signals and vibration signals and performing analysis thereof, the signal analyzer providing an output based on the analysis, the output including at least an indication of a condition of the at least one machine, and a control module initiating at least one of a repair event on the at least one machine, an adjustment to a maintenance schedule of the at least one machine and an adjustment to an operating parameter of the at least one machine based on the indication, whereby efficacy of the at least one machine is improved.

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Haworth, NJ, United States of America

Saar Yoskovitz