Kabushiki Kaisha Toshiba

Ryuuichi Teramoto

Seiji Onoue

A testing method includes: storing QC data for each of electronic device manufacturing processes in a storage unit; changing the QC data for each of the processes to a common fixed form of data; providing a contour for the QC data for each of the processes using the common fixed form of data; comparing a singularity map to a failure generation map for a completed device; and finding a causal process for a failure and a defect through the comparison.

Growing community of inventors

Yokohama, Japan

Ryuuichi Teramoto