Kabushiki Kaisha Toshiba

Shin Nippon Air Technologies Co., Ltd.

Ryuta Okamoto

Yoshitaka Egawa

Shinji Ohsawa

Hiroshige Goto

Akihiko Yoshizawa

Kyoichi Takenaka

Toshikazu Oda

Kazuhiko Sakamoto

Hiroshi Kawakita

Hiroyuki Okami

Yusuke Iso

Kazumasa Sanada

A particle concentration measuring device includes: a measurement region formation part which has a wall () of substantially ring-form and through an inner opening of which gas relatively flows orthogonally; a light curtain forming unit (A,B) forming a planar light curtain (FL) in the inner opening: a particle detecting unit () receiving scattered light from particles passing through the light curtain (FL) to detect the particles; and a calculating unit () calculating particle concentration based on the total number of the particles detected by the particle detecting unit () in a volume of an airflow passing through the light curtain (FL) in a unit time.

Particle concentration measuring device

A power supply voltage containing a noise component is supplied to each pixel at the time of sampling of a reset level of a signal read out from each pixel, and a power supply voltage in which the noise component is suppressed is supplied to each pixel at the time of sampling of a read level of the signal read out from each pixel.

Power-supply-noise cancelling circuit and solid-state imaging device

In a first signal conversion circuit, a first electrode of a first capacitor is connected to a first signal line, and a second electrode thereof is connected to a first node. In a second capacitor, a third electrode thereof is connected to a second signal line, and a fourth electrode thereof is connected to a second node. In a first inverting amplifier including a first negative feedback switch, a first input electrode is connected to the first node, and a first output electrode is connected to a third node. In a second inverting amplifier including a second negative feedback switch, a second input electrode is connected to the second node. A first averaging switch is connected between a first node and second node. A second averaging switch is connected between third node and fourth node.

Analog-signal processing circuit for improving accuracy of arithmetic mean of signals

A reference voltage generation circuit generates a reference voltage and outputs it to an amplifier reference voltage line. A power-supply-noise adding circuit adds power supply noise superimposed on a power supply to the reference voltage generated by the reference voltage generation circuit. A differential amplifier amplifies a difference between a voltage of a vertical signal line and a voltage of an amplifier reference voltage line and outputs the amplified voltage.

A solid-state image sensor which includes a pixel section, AD converter, line memory, controller and synthesizer is disclosed. The line memory stores a digital signal output from the AD converter. The controller controls the pixel section and AD converter to subject analog signals of different exposure times to an AD converting process by use of the AD converter and transfer the thus AD-converted signals to the line memory in an accumulation period of charges of one frame. The synthesizer is supplied with digital signals of different exposure times from the line memory, compare a fist signal obtained by adding signals of short and long exposure times with a second signal obtained by amplifying the signal of short exposure time by the ratio of the signal of short exposure time to the signal of long exposure time, select a larger one of the compared signals and output the selected signal.

Amplification-type CMOS image sensor of wide dynamic range

A level shift circuit encompasses a first transmission circuit configured to transmit a leading edge of an input signal, a second transmission circuit configured to transmit a trailing edge of the input signal, and a composite circuit configured to generate an output signal by synthesizing the leading edge and the trailing edge.

Growing community of inventors

Yokohama, Japan

Ryuta Okamoto