Fuji Jukogyo Kabushiki Kaisha

The University of Tokyo

Fujikura Limited

Ryujiro Nomura

Hideki Soejima

Koji Omichi

Masahiro Kondo

Kohki Ishikawa

Yoji Okabe

Takeshi Kizaki

Qi Wu

Katsuhiko Takeuchi

Displacement measuring device with light irradiation system, first and second FBGs and detecting system. The first FBG has first transmittance distribution or first reflectance distribution. The second FBG has second transmittance distribution or second reflectance distribution. The detecting system detects light passed through the first and second FBGs of which at least one of the first transmittance distribution and the second transmittance distribution changes in a wavelength direction with a change amount different from that of the other, according to a displacement amount of an object, or amplitude of the light passed through the first and the second FBGs of which at least one of the first reflectance distribution and the second reflectance distribution changes in the wavelength direction with a change amount different from that of the other, according to the displacement amount of the object, and acquires an index to indicate the displacement amount based on the amplitude.

Displacement measuring device and displacement measuring method

Growing community of inventors

Sakura, Japan

Ryujiro Nomura