Shishido Electrostatic, Ltd.

Iwate University

Matsumoto Giken Co., Ltd.

Ryuichi Takeuchi

Shinichi Yamaguchi

Chyon Hae Kim

Koichi Takaki

Katsuya Kubo

Hidemi Nagata

Yuki Kaneta

Katsuyuki Takahashi

Isao Hiyoshi

Nobuhiro Matsumoto

Yorioki Matsumoto

An electronic device of the present invention is an electronic device used around a neutralization target object, the electronic device includes: an electric part; an interconnection portion that transmits electric power of a high voltage power supply to the electric part; and a housing that accommodates the electric part and the interconnection portion, in which the electronic device includes at least one of a cover portion, which covers at least a part of the electric part and has a surface resistivity of equal to or higher than 10Ω/□ and equal to or lower than 10Ω/□, and the housing, which has a surface resistivity of equal to or higher than 10Ω/□ and equal to or lower than 10Ω/□.

Electronic device and manufacturing method of electronic device

A charged particle emission device includes a pre-emission state detector configured to detect a pre-emission charged state which is a charged state of the charged object before charged particles are emitted, an emission time generator configured to generate an emission time based on a past emission time of charged particles and a charged state of the charged object after the emission, emission processor circuitry configured to emit charged particles to the charged object which is in the pre-emission charged state based on the generated emission time, a post-emission state detector configured to detect a post-emission charged state which is a charged state of the charged object after the charged particles are emitted, machine learning processor circuitry configured to cause a machine learning model to learn a correspondence among the pre-emission charged state, the post-emission charged state, and the emission time generated by the emission time generator.

Charged particle emission device, system, method, and program

A charged particle emission device includes a pre-emission state detector configured to detect a pre-emission charged state which is a charged state of a charged object before the charged particles are emitted, a learned model configured to receive a charged state of a charged object and a control parameter related to a control amount used for control of the charged particles to be emitted to the charged object to generate an estimated charged state which is a charged state of the charged object after the charged particles are controlled under the control parameter and emitted, an estimated charged state generator configured to input the pre-emission charged state and a plurality of control parameters to the learned model to generate a plurality of estimated charged states corresponding to the pre-emission charged state and the plurality of control parameters.

Growing community of inventors

Tokyo, Japan

Ryuichi Takeuchi