National Institute of Advanced Industrial Science and Technology

Secretary of Agency of Industrial Science and Technology

Gastec Corporation

Ryuichi Naganawa

Kazutoshi Noda

Hiroaki Tao

Kunitoshi Matsunobu

Katsuhide Uchida

Kouta Kobayashi

Mamoru Tominaga

A gas analyzing apparatus including a reactor for decomposing a target substance contained in a gas to produce a product gas containing a decomposition product, a contacting chamber connected to the reactor and having a quartz oscillator disposed therewithin. The quartz oscillator has opposing surfaces each provided with an electrode, at least one of the electrodes being reactable with the decomposition product so that the decomposition product when contacted with the reactable electrode is reacted with the reactable electrode to cause a frequency deviation which is detected by a frequency measuring device.

Method of analyzing gas using quartz oscillator and apparatus therefor

In a method of analyzing a concentration of a target substance contained in a fluid using a quartz oscillator having a surface covered with a layer capable of absorbing the target substance, the temperature of the fluid and the quartz oscillator is controlled at substantially the same predetermined temperature selected according to the concentration of the target substance in said fluid, so that the analysis can be made with optimum sensitivity. A device for analyzing a concentration of a target substance contained in a fluid, includes a contacting chamber accommodating a quartz oscillator, a temperature controller, disposed in a feed passage for feeding the fluid into said contacting chamber, for adjusting a temperature of the fluid at a desired predetermined temperature; and a detector of a frequency of the quartz oscillator.

Method of analyzing concentration of target substance using quartz oscillator and device therefor

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Tsukuba, Japan

Ryuichi Naganawa