Tdk Corporation

Ryou Kobayashi

Hitoshi Ishida

Kaname Ueda

Akira Saitoh

Yasushi Izumibe

A method of production of a ceramic electronic device such as a multilayer ceramic capacitor, comprising forming a first ceramic coating layer on the surface of a substrate, forming an internal electrode on the surface of the first ceramic coating layer, then forming a second ceramic coating layer on the surface of the first ceramic coating layer so as to cover the internal electrode. In this case, when a mean particle size of ceramic particles of the first ceramic coating layer is &#x3b1;, a thickness of the first ceramic coating layer is T, a mean particle size of ceramic particles of the second ceramic coating layer is &#x3b1;, and a thickness of the second ceramic coating layer is T, the conditions of &#x3b1;, 0.05&#x3c;&#x3b1;&#x2266;0.35 &#x3bc;m, T&#x3c;T, and 0&#x3c;T&#x3c;1.5 &#x3bc;m are satisfied. As a result, it is possible to provide a ceramic electronic device, in particular a multilayer ceramic capacitor, resistant to short-circuit defects, withstand voltage defects, and other structural defects.

Ceramic electronic device and method of production of same

A method of production of a ceramic electronic device such as a multilayer ceramic capacitor, comprising forming a first ceramic coating layer on the surface of a substrate, forming an internal electrode on the surface of the first ceramic coating layer, then forming a second ceramic coating layer on the surface of the first ceramic coating layer so as to cover the internal electrode. In this case, when a mean particle size of ceramic particles of the first ceramic coating layer is &agr;1, a thickness of the first ceramic coating layer is T1, a mean particle size of ceramic particles of the second ceramic coating layer is &agr;2, and a thickness of the second ceramic coating layer is T2, the conditions of &agr;1&lE;&agr;2, 0.05<&agr;1&lE;0.35 &mgr;m, T1<T2, and 0<T1<1.5 &mgr;m are satisfied. As a result, it is possible to provide a ceramic electronic device, in particular a multilayer ceramic capacitor, resistant to short-circuit defects, withstand voltage defects, and other structural defects.

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Tokyo, Japan

Ryou Kobayashi