Anritsu Corporation

Ryota Takasu

Taichi Murakami

Yasuhiro Miyake

Soichiro Kai

An object of the present disclosure is to provide a loss analysis device and a loss analysis method of detecting an event with high reproducibility when an SN ratio is small or when an event interval is short. According to the present disclosure, a loss analysis device includes an OTDR waveform acquisition unit that acquires an OTDR waveform of a measurement target optical fiber, and a calculation unit that performs nonlinear fitting of an event model function to the OTDR waveform and calculates a position of a start point of each event included in the OTDR waveform, a level at the start point of each event, a loss of each event, and a return loss of each event, the event model function using the position, the level, the loss, and the return loss as parameters.

Loss analysis device and loss analysis method

An object of the present disclosure is to improve an SN ratio while maintaining a distance resolution and to accurately detect an event occurrence location. An event detection device according to the present disclosure includes: an OTDR waveform acquisition unit that acquires an OTDR waveform of an optical fiber to be measured; a feature quantity extraction unit that performs wavelet transform on the OTDR waveform and generates a scalogram with each wavelet coefficient as a feature quantity; a peak extraction unit that calculates a noise threshold value from the OTDR waveform, and extracts a peak from the feature quantity on the scalogram based on the noise threshold value to generate a peak graph; and an event identification unit that identifies an event in the optical fiber to be measured from the peak graph.

Event detection device and event detection method

It is possible to allow a user to easily distinguish between an event at a place to be resolved and an event at a place having no problem on a path of a PON communication network to be measured. A light intensity distribution of return light is processed in a time-series order to detect an event at each position on a network. A parameter Nrelating to the total number of splitters present on a path of the network is specified, the number Nof detections of the total number of splitters detected as an event is recognized, and in a case where 'N&#x3e;N', a last detected event is associated with one optical splitter and is further displayed as an 'uncertain splitter' in distinction from a normal splitter.

OTDR measurement apparatus and control method

Provided is an end face inspection device capable of inspecting different end face shapes without replacing an adapter for attachment. An end face inspection device includes: an optical system that forms an image of an end face of a test object, which is fixed at a predetermined position, at a position of an image sensor; and a focus detection section that acquires image data, which is output by the image sensor, and determines whether or not the end face is brought into focus in the image data. The focus detection section acquires a plurality of the image data pieces, in which parts of the end face are brought into focus by changing a focal position of the optical system by a predetermined distance at a time, and acquires focused image data by synthesizing the respective parts brought into focus in the plurality of image data pieces.

End face inspection device and focused image data acquisition method therefor

Provided are a measurement result display device and a measurement result display method which are capable of making a list of how much difference is present between an allowable value and a measurement value of each measurement item measured by a measuring instrument, in a visually discriminable state. An allowable upper limit value indicatorand an allowable lower limit value indicatorare disposed at display positions which are set in advance in a measurement result imageas positions indicating an allowable upper limit value and an allowable lower limit value, and a measurement value indicatoris disposed at a display position calculated from display positions of the allowable upper limit value indicatorand allowable lower limit value indicatorand a measurement value measured by the measurement unit

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Kanagawa, Japan

Ryota Takasu