Rohm Co., Ltd.

Ryosuke Sumii

Kiminobu Sato

Takayuki Matsuura

Katsuhiro Oshikawa

A self-diagnosis circuit (BST) configured to diagnose a fault detection circuit () including a first comparator (CMP) configured to be fed with a voltage based on a fault sensing target voltage (Vo) and a first reference voltage (Vref) includes a voltage switch circuit () configured to switch the level of a voltage based on a second reference voltage (Vref) and output the resulting voltage, a first path switch circuit () configured to switch between a path through which the voltage output from the voltage switch circuit is fed to the first comparator and a path through which the voltage based on the fault sensing target voltage is fed to the first comparator, and a control circuit () configured to control the voltage switch circuit and the path switch circuit.

Self-diagnosis circuit and semiconductor device

A soft start circuit accepts an input of a reference voltage set arbitrarily, and generates a soft start voltage that takes a predetermined sweep time to slowly rise from a predetermined lowest value to a highest value that is higher than the reference voltage and changes in accordance with the reference voltage.

Growing community of inventors

Kyoto, Japan

Ryosuke Sumii