Omron Corporation

Ryosuke Hasui

Keisuke Yano

Shigeru Aoyama

Takeo Nishikawa

Hideyuki Yamashita

Tomohiko Matsushita

Takaaki Yamada

Yutaro Okuno

Akira Takaishi

Hajime Tsubata

Hitoshi Tanaka

Hironori Ogawa

Masahiro Ozaki

Megumi Moriyama

Satoshi Fujita

A technique capable of shortening a period in which value of a PID parameter is outside of an appropriate range is provided. A measured value acquisition functional unit processes a sensing signal of a sensor that measures a barrel and acquires a measured value of the barrel. A storage unit stores a target value of the barrel and a PID parameter. An operation amount calculation functional unit calculates an amount of operation using the PID parameter and a difference between the measured value and the target value. A first output unit and a second output unit output the amount of operation. A first updating functional unit updates the PID parameter through a first update process when the variation range is greater than a first range, and a second updating functional unit updates the PID parameter through a second update process when the variation range is less than a second range.

PID control device, PID control method, and PID control program

A metal layermade of Au or the like is formed on the upper surface of a transparent substrateDielectric layersandwith different thicknesses are formed on the upper surface of the metal layer(any one of the dielectric layers can have a thickness of 0) to form respective determination areasandFurther, different types of antibodiesandare fixed on the upper surfaces of the respective dielectric layersandThen, light is directed to the determination areasandthen signals of light reflected by the determination areasandare received, the light is dispersed, and analyses are performed on signals resulted from the light dispersion to detect the conditions of the surfaces of the respective determination areas, at the same time.

Surface plasmon resonance sensor chip and surface plasmon resonance sensor

A sensor chip has a metal layer formed on a surface of a substrate, where a plurality of microscopic concave part is formed in a measurement region of the surface of the metal layer. When light of linear polarization is irradiated onto the measurement region, local resonance electric field generates at opposing metal layer surfaces in the concave part. The reflected light thereof is received to measure reflectance. The light of linear polarization is irradiated so that the polarizing surface becomes orthogonal to the longitudinal direction of the concave part.

Surface plasmon resonance sensor and sensor chip

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Nara, Japan

Ryosuke Hasui