Sharp Kabushiki Kaisha Corporation

Ryoji Minakata

Hidekazu Hayashi

Masashi Michijima

Akiyoshi Fujii

Mitsuhiko Yoshikawa

Tohru Kira

Tomohisa Komoda

Toru Kira

Hiroshi Suzuki

Atsuo Mukai

A magnetoresistive device has a first magnetic layer, a nonmagnetic layer, and a second magnetic layer, with the nonmagnetic layer being interposed between the first and second magnetic layers, the first and second magnetic layers having perpendicular magnetic anisotropy. Either the first magnetic layer or the second magnetic layer is made of a ferrimagnetic that has a compensation point around a room temperature.

Magnetoresistive device and magnetic memory using the same

A closed magnetic circuit layer is formed on a ferromagnetic layer serving as a memory layer of a magnetic tunnel junction device, in such a manner that a closed magnetic circuit layer is formed via a metal layer with a spacing at a central portion. With this structure, stable magnetization state can be ensured even for a miniaturized pattern.

Magnetic tunnel junction device, magnetic memory adopting the same, magnetic memory cell and access method of the same

A magnetic memory element has a first ferromagnetic layer, a second ferromagnetic layer, and a non-magnetic layer disposed between these ferromagnetic layers. The non-magnetic layer has an electrical characteristic that is changeable depending on an external magnetic field applied to the non-magnetic layer.

Magnetic memory element and magnetic memory using the same

A magnetic tunnel junction element includes a first magnetic layer and a second magnetic layer acting as a memory layer, and a first insulating layer sandwiched between the first and second magnetic layers. Further, the magnetic tunnel junction element includes a third magnetic layer on a side of the second magnetic layer opposite from the first insulating layer. This third magnetic layer constitutes a closed magnetic circuit together with the second magnetic layer.

Magnetic tunnel junction element and magnetic memory using the same

In a magnetic memory of the present invention which includes a magnetic memory element composed of at least a first ferromagnetic layer, a non-magnetic layer and a second ferromagnetic layer stacked, a third ferromagnetic layer is provided via at least one conductor layer, on one side of the second ferromagnetic layer the other side being closer to the non-magnetic layer. The magnetic memory elements can thereby be provided via a smaller interval in-between, thereby realizing a magnetic memory having higher density than a conventional magnetic memory. Further, the first conductor layer for supplying a current to provide magnetization information can be disposed in the vicinity of the second ferromagnetic layer as a storage layer, thereby providing a magnetic memory capable of generating magnetic poles sufficient to reverse magnetization even by a small current, and low power consumption.

Magnetic memory element, magnetic memory and manufacturing method of magnetic memory

A magnetoresistance effect type thin film magnetic head includes a MR element having the electrical resistance changed according to a change in an applied signal magnetic field, a lead electrode for detecting a voltage change generated across the ends of the MR element in which a change in electrical resistance is generated, and high coercive force films for applying a weak magnetic field to the MR element. The high coercive force films are arranged in the proximity of the ends of the MR element and at a predetermined position between the ends. According to this structure, a weak magnetic field is applied in uniform over the entire MR element to facilitate unification of magnetic domain of the MR element even in the case of a long MR element. Therefore, unification of magnetic domain can easily be carried out over the entire region of the MR element without increasing the film thickness of the high coercive force film even in a case of a wide track width, resulting in a thin film magnetic head with no Barkhausen noise generation.

Magnetoresistance effect type thin film magnetic head using high

A process for preparing a soft magnetic film of Permalloy on a rugged substrate in an inert gas atmosphere by a multielectrode sputtering method wherein the target voltage and the target current are independently controllable, the Permalloy film being prepared by:

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Nara, Japan

Ryoji Minakata