Hitachi Automotive Systems, Ltd.

Ryoichi Inada

Teppei Hirotsu

Hideyuki Sakamoto

Satoru Shigeta

Tatsuya Horiguchi

Kouichi Yahata

Keiji Kadota

There is achieved an electronic control device capable of calculating an optimal travel plan even during dynamic reconfiguration of a calculation circuit configuration. When a driving state changes, a travel plan parameter generation/selection unit divides evaluation calculation units into two blocks and performs reconfiguration of the respective evaluation calculation units a plurality of times via a reconfiguration control unit. While the evaluation calculation units are reconfigured, the evaluation calculation units performs evaluation calculation, and while the evaluation calculation units are reconfigured, the evaluation calculation units perform evaluation calculation. Thus, even while some of the evaluation calculation units are being reconfigured, it is possible to continue evaluation of the travel plan in the rest of the evaluation calculation units.

Electronic control device for autonomous driving of a vehicle

To carry out diagnosis of a current sensor while maintaining high reliability. An inverter control device according to the present invention controls an inverter circuit, calculates an estimated direct current value on the basis of a duty value and an alternating current sensor value output by an alternating current sensor, and performs diagnosis of a direct current sensor on the basis of the estimated direct current value and a direct current sensor value output by the direct current sensor.

Inverter control device and power conversion device

An object of the present invention is to diagnose an abnormality detecting circuit that detects an abnormality, such as an overcurrent of a power semiconductor, with the number of insulating elements to be additionally provided, inhibited from increasing. There are provided: a drive circuit configured to output a gate signal to a power semiconductor; an abnormality detecting circuit configured to detect an abnormality of the power semiconductor; and a diagnosis signal applying circuit configured to apply a diagnosis signal to the abnormality detecting circuit. The diagnosis signal applying circuit applies the diagnosis signal, on the basis of the gate signal output by the drive circuit.

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Tokyo, Japan

Ryoichi Inada