Murata Manufacturing Co., Ltd.

Nipro Corporation

Ryoichi Fukasawa

Takashi Kondo

Seiji Kamba

Kazuhiro Takigawa

Shigenori Tominaga

Tomofumi Ikari

A foreign matter detecting apparatus includes an oscillating unit, an optical system, a receiving unit, a scanning mechanism, and an operator. The oscillating unit generates a terahertz pulse wave and emits the terahertz pulse wave as irradiation light. The optical system guides the irradiation light to the first part of the container and condenses reflected light from the container. The receiving unit outputs a signal corresponding to the condensed reflected light and also measures an echo. The scanning mechanism scans a position of the irradiation light guided on the first part in a two-dimensional manner. The operator detects foreign matter in powder in a container based on at least one of a time waveform signal, a reflection image, a power spectrum, a tomographic image, and a frequency image. The time waveform signal is output from the receiving unit in chronological order.

Foreign-matter detecting apparatus and method for detecting foreign-matter in powder using terahertz pulse wave

A measuring method for measuring characteristics of an object to be measured, the measuring method including holding the object on a void-arranged structure having at least two void portions that pass therethrough in a direction perpendicular to a principal surface thereof, and applying electromagnetic waves to the void-arranged structure on which the object is held to detect frequency characteristics of the electromagnetic waves transmitted through the void-arranged structure. The void-arranged structure has a grid structure in which the void portions are periodically arranged in at least one direction on the principal surface of the void-arranged structure. The characteristics of the object are measured on the basis of a relationship between a first frequency characteristic and a second frequency characteristic.

Method and apparatus for measuring characteristics of object

Growing community of inventors

Ohtawara, Japan

Ryoichi Fukasawa