National Institute of Advanced Industrial Science and Technology

Daikin Industries, Ltd.

Ryo Sakamaki

Masahiro Horibe

Taku Yamanaka

Hiroyuki Yoshimoto

Dai Fukami

Yuto Kato

A method that includes changing a probe angle with respect to the conductor surface of a substrate that has a flat conductor surface mounted on the mounting surface of a stage in a high-frequency test system, thereby changing the state of contact of the tip of a signal terminal and tip of a ground terminal with the conductor surface, outputting high-frequency signals from the signal terminal to the conductor surface and receiving reflected signals using the probe to find S-parameters at different probe angles, and determining, based on a plurality of the S-parameters, a reference probe angle at which the reference line formed connecting the tip of the signal terminal and tip of the ground terminal is parallel with the conductor surface.

Method for determining probe angle, high-frequency test system, program and storage medium

A high-frequency characteristic inspection apparatus includes a pair of high-frequency probes that inspect an electrical characteristic of a plane circuit including a signal region and a ground region formed apart from each other by an S parameter obtained by pushing a tip against a surface of the plane circuit and discharging a high frequency and a measurement apparatus. The high-frequency probe includes a ground terminal that is in contact with the ground region at its tip and a signal terminal that is in contact with the signal region simultaneously with the ground terminal at its tip. The pair of high-frequency probes are configured to contact with a surface of the plane circuit at the same time while facing each other at a certain interval.

High-frequency probe position correction technology

The invention provides a dielectric waveguide for transmitting millimeter waves or sub-millimeter waves. The dielectric waveguide is easily processed and connected even when having a small diameter, and can provide a connection structure exhibiting low transmission and return losses of high frequency signals. The dielectric waveguide includes a dielectric waveguide body and a dielectric waveguide end having a lower permittivity than the dielectric waveguide body. The dielectric waveguide body and the dielectric waveguide end are seamlessly and monolithically formed from the same material.

Growing community of inventors

Tsukuba, Japan

Ryo Sakamaki